Strain tensor evaluation in polycrystalline materials by scanning high-energy X-ray diffraction

被引：1
作者：
Borbely, Andras [1 ]
机构：
[1] Univ Lyon, CNRS, UMR 5307, LGF,Ctr SMS,Mines St Etienne, F-42023 St Etienne, France
来源：
JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2020年 / 53卷
关键词：
intragranular strain; X-ray diffraction; 3DXRD; tomography; CONTRAST TOMOGRAPHY; MICROSCOPY; DEFORMATION;
D O I：
10.1107/S1600576720001661
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：312 / 313
页数：2
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