Growth control of carbon nanotube using various applied electric fields for electronic device applications
被引:9
|
作者:
Maeda, M
论文数: 0引用数: 0
h-index: 0
机构:Univ Tsukuba, Tsukuba, Ibaraki 3058571, Japan
Maeda, M
Hyon, CK
论文数: 0引用数: 0
h-index: 0
机构:Univ Tsukuba, Tsukuba, Ibaraki 3058571, Japan
Hyon, CK
Kamimura, T
论文数: 0引用数: 0
h-index: 0
机构:Univ Tsukuba, Tsukuba, Ibaraki 3058571, Japan
Kamimura, T
Kojima, A
论文数: 0引用数: 0
h-index: 0
机构:Univ Tsukuba, Tsukuba, Ibaraki 3058571, Japan
Kojima, A
Sakamoto, K
论文数: 0引用数: 0
h-index: 0
机构:Univ Tsukuba, Tsukuba, Ibaraki 3058571, Japan
Sakamoto, K
Matsumoto, K
论文数: 0引用数: 0
h-index: 0
机构:Univ Tsukuba, Tsukuba, Ibaraki 3058571, Japan
Matsumoto, K
机构:
[1] Univ Tsukuba, Tsukuba, Ibaraki 3058571, Japan
[2] Osaka Univ, Osaka 5670047, Japan
[3] Meiji Univ, Kawasaki, Kanagawa 2148571, Japan
[4] JST, CREST, Kawaguchi, Saitama 3320012, Japan
来源:
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS
|
2005年
/
44卷
/
4A期
关键词:
carbon nanotube;
electric field;
growth direction;
constant DC bias;
ramp bias;
D O I:
10.1143/JJAP.44.1585
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
The control of the growth direction of a carbon nanotube was accomplished by applying an electric field during the growth of the carbon nanotube. The effects of two types of applied bias, one is a constant DC bias, and the other is a ramp bias, on the control of the growth direction were. examined. By maintaining a constant DC bias we could control the growth direction of the carbon nanotube, however, the bridging ratio between the two electrodes was as small as 35%. We suppose that this low bridging ratio may be caused by the etching effect of hydrogen. When a ramp bias was applied, bridging ratio tended to increase with the slope of ramp bias. Under optimal conditions, the bridging ratio reached a value as high as 95%.
机构:
Univ Calif San Diego, Mat Sci & Engn Program, Mech & Aerosp Engn Dept, La Jolla, CA 92093 USAUniv Calif San Diego, Mat Sci & Engn Program, Mech & Aerosp Engn Dept, La Jolla, CA 92093 USA
AuBuchon, Joseph F.
Chen, Li-Han
论文数: 0引用数: 0
h-index: 0
机构:
Univ Calif San Diego, Mat Sci & Engn Program, Mech & Aerosp Engn Dept, La Jolla, CA 92093 USAUniv Calif San Diego, Mat Sci & Engn Program, Mech & Aerosp Engn Dept, La Jolla, CA 92093 USA
Chen, Li-Han
Jin, Sungho
论文数: 0引用数: 0
h-index: 0
机构:
Univ Calif San Diego, Mat Sci & Engn Program, Mech & Aerosp Engn Dept, La Jolla, CA 92093 USAUniv Calif San Diego, Mat Sci & Engn Program, Mech & Aerosp Engn Dept, La Jolla, CA 92093 USA
机构:
IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USAIBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA
Freitag, Marcus
Steiner, Mathias
论文数: 0引用数: 0
h-index: 0
机构:
IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USAIBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA
Steiner, Mathias
Naumov, Anton
论文数: 0引用数: 0
h-index: 0
机构:
IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA
Rice Univ, Appl Phys Program, Houston, TX 77005 USAIBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA
Naumov, Anton
Small, Joshua P.
论文数: 0引用数: 0
h-index: 0
机构:
IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USAIBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA
Small, Joshua P.
Bol, Ageeth A.
论文数: 0引用数: 0
h-index: 0
机构:
IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USAIBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA
Bol, Ageeth A.
Perebeinos, Vasili
论文数: 0引用数: 0
h-index: 0
机构:
IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USAIBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA
Perebeinos, Vasili
Avouris, Phaedon
论文数: 0引用数: 0
h-index: 0
机构:
IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USAIBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA
机构:
Department of Mechanical and Industrial Engineering, Northeastern University, Boston, 02115, MADepartment of Mechanical and Industrial Engineering, Northeastern University, Boston, 02115, MA