Microstructural features of wear-resistant titanium nitride coatings deposited by different methods

被引:57
作者
Fortuna, SV
Sharkeev, YP
Perry, AJ
Matossian, JN
Shulepov, IA
机构
[1] Tomsk State Univ Architecture & Bldg, Tomsk 634003, Russia
[2] Russian Acad Sci, Inst Strength Phys & Mat Sci, Tomsk 634021, Russia
[3] AIMS Consulting, CH-9470 Buchs SG, Switzerland
[4] HRL Labs, Malibu, CA 90265 USA
[5] Tomsk Polytech Univ, Inst Phys Nucl, Tomsk 634050, Russia
关键词
titanium nitride; microstructure; transmission electron microscopy (TEM);
D O I
10.1016/S0040-6090(00)01438-3
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Titanium nitride, TiN, is used as wear protective and decorative coatings in various applications. These coatings are deposited by standard industrial methods such as chemical and physical vapor deposition (CVD and PVD, respectively), including magnetron sputtering or its modifications [e.g. the plasma-enhanced magnetron sputtered deposition (PMD) method]. The coatings have different microstructures (size and morphology of grains, orientation, dislocation structure, residual stress, etc.) depending on the method used and the deposition regime. The results of comparative transmission electron microscopy (TEM) investigations of the microstructure of thin TiN coatings deposited by classical CVD and PVD, including PMD, are presented. The microstructure was studied in sections perpendicular and parallel to the coating surface. The grain size was estimated from dark field images and the residual stress was determined using the bend extinction contours in the bright field images. It was found that the coatings deposited by PVD and CVD methods have different grain microstructures and residual stresses. The CVD coatings have an equiaxed microcrystalline structure with very low levels of the local residual stress. The mean grain size is 0.4-0.6 mum. The PVD coatings (Balzers and Metaplas) have a non-equilibrium submicron grain structure with a high level of the local residual stress equal to 0.06-0.08E, where E is Young's modulus, and a mean grain size of 0.1-0.2 mum in the section parallel to the coating surface. The PMD coating structure is highly non-equilibrium nanocrystalline, with a very high level of residual stress equal to 0.13E and a much finer grain size of 0.06 mum. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:512 / 517
页数:6
相关论文
共 26 条
  • [1] A study of the interfacial structure between the TiN film and the iron nitride layer in a duplex plasma surface treatment
    Baek, WS
    Kwon, SC
    Lee, SR
    Rha, JJ
    Nam, ES
    Lee, JY
    [J]. SURFACE & COATINGS TECHNOLOGY, 1999, 114 (01) : 94 - 100
  • [2] THE PREPARATION OF CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY SPECIMENS OF NB/AL MULTILAYER THIN-FILMS ON SAPPHIRE SUBSTRATES
    BARMAK, K
    RUDMAN, DA
    FONER, S
    [J]. JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1990, 16 (03): : 249 - 253
  • [3] Barvinok V. A., 1990, CONTROL STRESSED STA
  • [4] HARD COATINGS
    BUNSHAH, RF
    DESHPANDEY, CV
    [J]. VACUUM, 1989, 39 (10) : 955 - 965
  • [5] Film properties of Ti/TiN bilayers deposited sequentially by ionized physical vapor deposition
    Cerio, F
    Drewery, J
    Huang, E
    Reynolds, G
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1998, 16 (03): : 1863 - 1867
  • [6] DEDKOV VC, 1992, ZAVODSK LAB, V58, P38
  • [7] Microstructural characterization of binary and ternary hard coating systems for wear protection.: Part I:: PVD coatings
    Dörfel, I
    Österle, W
    Urban, I
    Bouzy, E
    [J]. SURFACE & COATINGS TECHNOLOGY, 1999, 111 (2-3) : 199 - 209
  • [8] GEIST DE, 1995, ADV XRAY ANAL, V38, P471
  • [9] Characterization of zirconium nitride coatings deposited by cathodic arc sputtering
    Gruss, KA
    Zheleva, T
    Davis, RF
    Watkins, TR
    [J]. SURFACE & COATINGS TECHNOLOGY, 1998, 107 (2-3) : 115 - 124
  • [10] Microstructure analysis of plasma immersion ion implanted diamond-like carbon coatings
    Hamdi, AH
    Qiu, X
    Malaczynski, GW
    Elmoursi, AA
    Simko, S
    Militello, MC
    Balogh, MP
    Wood, BP
    Walter, KC
    Nastasi, MA
    [J]. SURFACE & COATINGS TECHNOLOGY, 1998, 104 : 395 - 400