Deposition of fluoropolymer thin films containing semiconductor microcrystallites by VUV laser ablation

被引：3

作者：

Fujii, T ^{[1
]}

Inoue, S ^{[1
]}

Kannari, F ^{[1
]}

机构：

[1] KEIO UNIV,FAC SCI & TECHNOL,DEPT ELECT ENGN,KOHOKU KU,YOKOHAMA,KANAGAWA 223,JAPAN

来源：

APPLIED SURFACE SCIENCE | 1996年 / 96-8卷

关键词：

D O I：

10.1016/0169-4332(95)00556-0

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Combining deposition of crystalline thin films of polytetrafluoroethylene (PTFE) via F-2 laser (157 nm) ablation with CdTe microcrystallites synthesis in sizes of 3-7 nm via KrF laser (248 nm) ablation, CdTe microcrystallites-doped PTFE thin films were fabricated. The X-ray photoemission spectra show that the main architecture of PTFE and CdTe is maintained in the doped films. CdTe microcrystallites doped in PTFE matrix show an absorption edge shift toward higher energy region and a third-order optical nonlinearity, which are induced by the quantum size effect.

引用

页码：621 / 624

页数：4

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