Evaluation of accuracy of manufacturers models of SiC MOSFETs
被引:1
作者:
Bisewski, Damian
论文数: 0引用数: 0
h-index: 0
机构:
Uniwersytet Morski Gdyni, Katedra Elektroniki Morskiej, Ul Morska 81-87, PL-81225 Gdynia, PolandUniwersytet Morski Gdyni, Katedra Elektroniki Morskiej, Ul Morska 81-87, PL-81225 Gdynia, Poland
Bisewski, Damian
[1
]
Lubicz-Krosnicka, Emilia
论文数: 0引用数: 0
h-index: 0
机构:
Uniwersytet Morski Gdyni, Katedra Elektroniki Morskiej, Ul Morska 81-87, PL-81225 Gdynia, PolandUniwersytet Morski Gdyni, Katedra Elektroniki Morskiej, Ul Morska 81-87, PL-81225 Gdynia, Poland
Lubicz-Krosnicka, Emilia
[1
]
机构:
[1] Uniwersytet Morski Gdyni, Katedra Elektroniki Morskiej, Ul Morska 81-87, PL-81225 Gdynia, Poland
来源:
PRZEGLAD ELEKTROTECHNICZNY
|
2021年
/
97卷
/
12期
关键词:
modelling;
MOSFET;
SiC;
SPICE;
D O I:
10.15199/48.2021.12.39
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
The paper concerns on modelling of the characteristics and parameters of power MOSFETs made of silicon carbide. The current commercial status of SiC-MOSFETs and information on the availability of manufacturers models of considered transistors have been discussed. The structure and principle of operation of the models offered by selected manufacturers of SiC-MOSFETs have been presented. An evaluation of accuracy of these models have been presented by comparing the simulation results and catalogue characteristics.