Three-dimensional characterization of microstructure by electron back-scatter diffraction

被引：121
|
作者：
Rollett, Anthony D. [1 ]
Lee, S.-B.
Campman, R.
Rohrer, G. S.
机构：
[1] Carnegie Mellon Univ, Dept Mat Sci & Engn, Pittsburgh, PA 15213 USA
[2] United States Steel Corp, Clairton, PA 15025 USA
来源：
ANNUAL REVIEW OF MATERIALS RESEARCH | 2007年 / 37卷
关键词：
orientation scanning; statistical reconstruction; microscopy texture; EBSD;
D O I：
10.1146/annurev.matsci.37.052506.084401
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The characterization of microstructures in three dimensions is reviewed, with an emphasis on the use of automated electron back-scatter diffraction techniques. Both statistical reconstruction of polycrystalline structures from multiple cross sections and reconstruction from parallel, serial sections are discussed. In addition, statistical reconstruction of second-phase particle microstructures from multiple cross sections is reviewed.
引用
收藏
页码：627 / 658
页数：32
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