An assessment of wide bandgap semiconductors for power devices

被引:432
|
作者
Hudgins, JL [1 ]
Simin, GS [1 ]
Santi, E [1 ]
Khan, MA [1 ]
机构
[1] Univ S Carolina, Dept Elect Engn, Columbia, SC 29208 USA
关键词
breakdown voltage; critical electric field; diamond; GaN; power electronics; SiC; specific on-resistance; wide bandgap;
D O I
10.1109/TPEL.2003.810840
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An advantage for some wide bandgap materials, that is often overlooked, is that the thermal coefficient of expansion (CTE) is better matched to the Peramics in use for packaging technology. It is shown that the optimal choice for uni-polar devices is clearly GaN. It is further shown that the future optimal choice for bipolar devices is C (diamond) owing to the large bandgap, high thermal conductivity, and large electron and hole mobilities. A new expression relating the critical electric field for breakdown in abrupt junctions to the material bandgap energy is derived and is further used to derive new expressions for specific on-resistance in power semiconductor devices. These new expressions are compared to the previous literature and the efficacy of specific power devices, such as heterojunction MOSFETs, using GaN are discussed.
引用
收藏
页码:907 / 914
页数:8
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