Time-resolved shot-by-shot photoelectron spectroscopy of autoionizing Xe+ states by EUV-free-electron-laser and near-IR laser pulses

被引：1

作者：

Fushitani, Mizuho ^{[1
,2
]}

Kawabe, Yoshitaka ^{[1
]}

Fujise, Hikaru ^{[1
]}

Yamada, Makoto ^{[1
]}

Hasegawa, Hiroka ^{[1
]}

Owada, Shigeki ^{[2
,3
]}

Togashi, Tadashi ^{[2
,3
]}

Nakajima, Kyo ^{[2
,3
]}

Yabashi, Makina ^{[2
,3
]}

Matsuda, Akitaka ^{[1
,2
]}

Hikosaka, Yasumasa ^{[2
,4
]}

Hishikawa, Akiyoshi ^{[1
,2
,5
]}

机构：

[1] Nagoya Univ, Grad Sch Sci, Chikusa Ku, Furo Cho, Nagoya, Aichi 4648602, Japan

[2] RIKEN, SPring 8 Ctr, 1-1-1 Koto, Sayo, Hyogo 6795148, Japan

[3] Japan Synchrotron Radiat Res Inst, 1-1-1 Koto, Sayo, Hyogo 6795148, Japan

[4] Univ Toyama, Inst Liberal Arts & Sci, 2630 Sugitani, Toyama, Toyama 9300194, Japan

[5] Nagoya Univ, Res Ctr Mat Sci, Chikusa Ku, Furo Cho, Nagoya, Aichi 4648602, Japan

来源：

PHYSICAL REVIEW A | 2021年 / 104卷 / 02期

关键词：

DOUBLE PHOTOIONIZATION; CORRELATION SATELLITES; DOUBLE-IONIZATION; HIGH-RESOLUTION; THRESHOLD PHOTOELECTRON; CROSS-SECTIONS; SPECTRA; KR; ULTRAVIOLET; DYNAMICS;

D O I：

10.1103/PhysRevA.104.023102

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Ultrafast dynamics of highly excited Rydberg states of Xe+ is investigated by time-resolved shot-by-shot photoelectron spectroscopy with EUV-free-electron-laser pump (40.8 eV) and near-infrared probe (1.56 eV) pulses. Sorting the single-shot spectra in the order of relative delay between the two pulses allows for investigating ultrafast decays of intermediate states participating in the double ionization of Xe. Observed photoelectron spectra show a biexponential decay within similar to 100 fs and similar to 300 ps in addition to constant signals lasting longer than 1 ns. These ultrafast decays reflect the lifetimes of autoionizing Rydberg states converging to electronically excited states of Xe2+. The results demonstrate that time-resolved shot-by-shot EUV-free-electron-laser photoelectron spectroscopywith a synchronized optical laser provides a powerful tool for investigating ultrafast electron emission processes.

引用

页数：8