Application of linear CCD in tunnel crack detection

被引：0

作者：

Liu Jie ^{[1
,2
]}

Li Hua ^{[2
]}

Jiang Xin ^{[2
]}

Chang Hemin ^{[2
]}

机构：

[1] Univ Chinese Acad Sci, Beijing 100049, Peoples R China

[2] Chinese Acad Sci, Xian Inst Opt & Precis Mech, Xian 710119, Peoples R China

来源：

SECOND INTERNATIONAL CONFERENCE ON PHOTONICS AND OPTICAL ENGINEERING | 2017年 / 10256卷

关键词：

Linear CCD; the tunnel crack; optical detection;

D O I：

10.1117/12.2257653

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

To meet the actual demand, the linear CCD technology is applied to tunnel crack detection, and an edge detection algorithm is proposed to measure the crack width. Firstly, the application form of linear CCD imaging technology in tunnel crack detection is introduced concretely in this paper. Then, the key influencing parameters of measurement are discussed. Finally, an edge detection algorithm based on the change of gray level in linear direction is proposed and it is verified by experiments. Experimental results indicated that the linear CCD imaging technology in tunnel crack detection could obtain measurement data quickly and improve the efficiency of tunnel cracks' measurement, and that the detection algorithm could be used for the crack width measuring.

引用

页数：5

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