Application of X-ray diffraction to the study of limestone patinas

被引:1
|
作者
Brunet-Imbault, B [1 ]
Rannou, I [1 ]
Muller, F [1 ]
Rautureau, M [1 ]
机构
[1] Univ Orleans, Ctr Rech, Mat Div, CNRS, F-45067 Orleans 2, France
来源
JOURNAL DE PHYSIQUE IV | 1998年 / 8卷 / P5期
关键词
D O I
10.1051/jp4:1998567
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The aim of this study in monumental limestone alteration is to characterize the superficial stone zone called patina where transformation processes due to air and water occur. The patina studied presents four thin coloured layers. It is difficult to separate precisely each layer to prepare powder samples; therefore X-ray diffraction study has been carried out with bulk samples, This allows us to study the stone in thickness with shifting it in translation. Patina mineralogical composition can be known every 100 mu m with a precision of 100 mu m on the beam position on the sample. It is difficult to have: quantitative results with bulk natural stone sample because of X-ray beam size: the mineralogical composition is inhomogeneous in the 0.15 to 0.6 mm(1) studied and there exist crystallite orientation phenomena. This study has permitted us to differentiate patina as it contains one more mineralogical phase : gypsum.
引用
收藏
页码:525 / 530
页数:6
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