A self checking Reed Solomon encoder: Design and analysis

被引：5

作者：

Cardarilli, GC ^{[1
]}

Pontarelli, S ^{[1
]}

Re, M ^{[1
]}

Salsano, A ^{[1
]}

机构：

[1] Univ Roma Tor Vergata, Dept Elect Engn, Rome, Italy

来源：

DFT 2005: 20TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS | 2005年

关键词：

D O I：

10.1109/DFTVS.2005.13

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Reed Solomon codes are widely used to identify and correct data errors in transmission and storage systems. Due to the vital importance of these blocks, a very important research topic is the study of the effects of faults on their behavior. The presented architecture exploits some properties of the arithmetic operations on GF(2(n)) Galois Field, related to the parity of the binary representation of the elements of the field. The encoder has been mapped on an SRAM based FPGA, the self-checking property has been analyzed using a SEU fault model and the performances in terms of area and delay overhead are presented.

引用

页码：111 / 119

页数：9

共 12 条

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