Tip-induced local reconstruction on the Pb/Ge(111) surface using frequency modulation atomic force microscopy

被引：2

作者：

Ohiso, Akihiro ^{[1
]}

Sugimoto, Yoshiaki

Abe, Masayuki

Moritai, Seizo

机构：

[1] Osaka Univ, Grad Sch Engn, Osaka 5650871, Japan

[2] Japan Sci & Technol Agcy, PRESTO, Kawaguchi, Saitama 3320012, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2007年 / 46卷 / 8B期

关键词：

non-contact atomic force microscopy; FM-AFM; atom manipulation; atom interchange; phase transition; Ge(111);

D O I：

10.1143/JJAP.46.5582

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We perform the local structure change on Pb/Ge(111) by frequency modulation atomic force microscopy (FM-AFM). The positions of the Pb and Ge adatoms embedded in the plane of the Pb/Ge(111)-c(2 x 8) surface system are interchanged using the AFM tip. We collect the Pb adatoms into a local area to induce the local structure change to a (2 x 2) periodic structure. Then, in the same manner, we change the local (2 x 2) phase back to the original c(2 x 8) structure.

引用

页码：5582 / 5585

页数：4

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