Experimental and theoretical analysis of the carrier distribution in asymmetric multiple quantum-well InGaAsP lasers

被引:21
|
作者
Hamp, MJ [1 ]
Cassidy, DT [1 ]
机构
[1] McMaster Univ, Dept Engn Phys, Hamilton, ON L8S 4L7, Canada
关键词
charge carrier processes; charge injection; diodes; quantum-well lasers; semiconductor lasers;
D O I
10.1109/3.892730
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The authors present an experimental and theoretical analysis of the carrier distribution in multiple quantum-well (MQW) lasers and the effect of this carrier distribution on the gain of wells at different locations in the active region. An experimental technique using mirror image asymmetric multiple quantum-well (AMQW) lasers is described which provides quantitative information on the degree to which the carrier distribution affects the gain of quantum wells (QWs) in the active region. A gain model for AMQW lasers is developed and used to explain some important characteristics of AMQW devices. A rate equation model is presented which incorporates the effects of fields across the p-i-n junction active region. The models able to predict experimental results measured from thirteen AMQW laser structures to within experimental uncertainty.
引用
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页码:92 / 99
页数:8
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