Enhancement and proof of accuracy of industrial computed tomography (CT) measurements

被引:76
作者
Bartscher, M. [1 ]
Hilpert, U.
Goebbels, J.
Weidemann, G.
机构
[1] Phys Tech Bundesanstalt, Coordinate Metrol Sect, Braunschweig, Germany
[2] BAM Fed Inst Mat Res & Testing, Computed Tomog Lab, Berlin, Germany
关键词
coordinate measuring machine (CMM); x-ray; uncertainty;
D O I
10.1016/j.cirp.2007.05.118
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Computed tomography (CT) is a well-established technology in medical diagnostics. For a few years now, dedicated CT systems have also been in use for dimensional measurements in industry. However, as far as the accuracy and reliability of the results is concerned, many problems are still unsolved. This paper describes concepts and first results for solving these problems. CT-specific reference standards and procedures for their application - similar to the acceptance and verification procedures of classical coordinate measuring technology - have been developed. In this paper, concepts and recent results are presented. They illustrate the technological and technical aspects and indicate the attractiveness of this new measurement technology.
引用
收藏
页码:495 / 498
页数:4
相关论文
共 9 条
[1]  
AIAG, 2006, PROD PART APPR PROC
[2]  
BARTSCHER M, 2004, DIMENSIONELLE MESSAB
[3]  
FIEDLER D, 2004, EIMENSIONELLE MESSAB
[4]  
FLANNERY BP, 1987, THREE DIMENSIONAL XR, V237
[5]  
Hsieh J, 2003, SPIE PRESS MONOGRAPH, VPM114
[6]  
Kak A.C. Slaney M., 1999, PRINCIPLES COMPUTERI
[7]  
SAEWERT HC, 2003, OBTAINING DIMENSIONA
[8]   Optical methods for dimensional metrology in production engineering [J].
Schwenke, H ;
Neuschaefer-Rube, U ;
Pfeifer, T ;
Kunzmann, H .
CIRP ANNALS-MANUFACTURING TECHNOLOGY, 2002, 51 (02) :685-699
[9]  
WENIG P, 2006, EXAMINATION MEASUREM