A comparison of modern data analysis methods for X-ray and neutron specular reflectivity data

被引:19
|
作者
van der Lee, A.
Salah, F.
Harzallah, B.
机构
[1] Univ Montpellier 2, Inst Europeen Membranes, CNRS, UMR 5635, F-34095 Montpellier 5, France
[2] Lab Physicochim Mat, Dept Phys, Fac Sci, Monastir 5000, Tunisia
关键词
D O I
10.1107/S0021889807032207
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Data analysis methods for specular X-ray or neutron reflectivity are compared. The methods that have been developed over the years can be classified into different types. The so-called classical methods are based on Parrat's or Abeles' formalism and rely on minimization using more or less evolved Levenberg Marquardt or simplex routines. A second class uses the same formalism, but optimization is carried out using simulated annealing or genetic algorithms. A third class uses alternative expressions for the reflectivity, such as the Born approximation or distorted Born approximation. This makes it easier to invert the specular data directly, coupled or not with classical least-squares or iterative methods using over-relaxation or charge-flipping techniques. A fourth class uses mathematical methods founded in scattering theory to determine the phase of the scattered waves, but has to be coupled in certain cases with ( magnetic) reference layers. The strengths and weaknesses of a number of these methods are evaluated using simulated and experimental data. It is shown that genetic algorithms are by far superior to traditional and advanced least-squares methods, but that they fail when the layers are less well defined. In the latter case, the methods from the third or fourth class are the better choice, because they permit at least a first estimate of the density profile to be obtained that can be refined using the classical methods of the first class. It is also shown that different analysis programs may calculate different reflectivities for a similar chemical system. One reason for this is that the representation of the layers is either described by chemical composition or by scattering length or electronic densities, between which the conversion of the absorptive part is not straightforward. A second important reason is that routines that describe the convolution with the instrumental resolution function are not identical.
引用
收藏
页码:820 / 833
页数:14
相关论文
共 50 条
  • [31] Anaklasis: a compact software package for model-based analysis of specular neutron and X-ray reflectometry data sets
    Koutsioubas, Alexandros
    Journal of Applied Crystallography, 2021, 54 : 1857 - 1866
  • [32] Statistical evaluation of the accuracy of structure parameter determination from x-ray and neutron reflectivity data
    Konovalov, OV
    Feigin, LA
    Shchedrin, BM
    KRISTALLOGRAFIYA, 1996, 41 (04): : 640 - 643
  • [33] Thin film and surface characterization by specular X-ray reflectivity
    Chason, E
    Mayer, TM
    CRITICAL REVIEWS IN SOLID STATE AND MATERIALS SCIENCES, 1997, 22 (01) : 1 - 67
  • [34] Neural network analysis of neutron and X-ray reflectivity data: automated analysis using mlreflect, experimental errors and feature engineering
    Greco, Alessandro
    Starostin, Vladimir
    Edel, Evelyn
    Munteanu, Valentin
    Russegger, Nadine
    Dax, Ingrid
    Shen, Chen
    Bertram, Florian
    Hinderhofer, Alexander
    Gerlach, Alexander
    Schreiber, Frank
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2022, 55 : 362 - 369
  • [35] Solution to the phase problem for specular x-ray or neutron reflectivity from thin films on liquid surfaces
    Blasie, JK
    Zheng, S
    Strzalka, J
    PHYSICAL REVIEW B, 2003, 67 (22):
  • [36] The Coherent Limitation of the Specular X-ray and Neutron Reflectivity on the Characterization of the Physical Vapor Deposition Thin Films
    Lee, Chih-Hao
    Chuang, Pei-Yu
    Lin, Yu-Shou
    Wu, Yu-Han
    CHINESE JOURNAL OF PHYSICS, 2012, 50 (02) : 301 - 310
  • [37] DATA FOR X-RAY ANALYSIS
    BELL, RL
    BRITISH JOURNAL OF APPLIED PHYSICS, 1964, 15 (12): : 1591 - &
  • [38] Analysis methods in neutron and X-ray reflectometry
    Lovell, MR
    Richardson, RM
    CURRENT OPINION IN COLLOID & INTERFACE SCIENCE, 1999, 4 (03) : 197 - 204
  • [39] Is the Calcite-Water Interface Understood? Direct Comparisons of Molecular Dynamics Simulations with Specular X-ray Reflectivity Data
    Fenter, Paul
    Kerisit, Sebastien
    Raiteri, Paolo
    Gale, Julian D.
    JOURNAL OF PHYSICAL CHEMISTRY C, 2013, 117 (10): : 5028 - 5042