Improvement of the SRH bulk lifetime upon formation of n-type POLO junctions for 25% efficient Si solar cells

被引:66
作者
Kruegener, Jan [1 ]
Haase, Felix [2 ]
Rienaecker, Michael [2 ]
Brendel, Rolf [2 ,3 ]
Osten, H. Joerg [1 ,3 ]
Peibst, Robby [1 ,2 ]
机构
[1] Leibniz Univ Hannover, Inst Elect Mat & Devices MBE, Schneiderberg 32, D-30167 Hannover, Germany
[2] Inst Solar Energy Res Hamelin ISFH, Ohrberg 1, D-31860 Emmerthal, Germany
[3] Leibniz Univ Hannover, Lab Nano & Quantum Engn, Schneiderberg 39, D-30167 Hannover, Germany
关键词
Passivating contact; Polysilicon; Gettering; Silicon solar cell; CARRIER-SELECTIVE POLYSILICON; RECOMBINATION BEHAVIOR; GETTERING MECHANISMS; INTERSTITIAL IRON; OXIDE JUNCTIONS; SILICON; DIFFUSION; IMPURITY; DEFECTS; NICKEL;
D O I
10.1016/j.solmat.2017.05.055
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Carrier-selective contact schemes, like polysilicon on oxide (POLO), provide low contact resistivities while preserving an excellent passivation quality. These junctions offer an important additional feature compared to a-Si/c-Si We find that the formation of n-type POLO junctions lead to a huge increase of the Shockley-Read-Hall (SRH) lifetime of the substrate, a prerequisite for highly efficient solar cells. The SRH lifetime improvement can be observed for both bulk polarities and for a variety of bulk resistivities. Thus we suggest that the highly doped POLO junction getters impurities that have more or less symmetric SRH capture cross sections. We are able to achieve SRH lifetimes of > 50 ms. By applying POLO junctions to interdigitated back contact cells, we achieve cells with an efficiency of 25%.
引用
收藏
页码:85 / 91
页数:7
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