Decreased degradation of poly(p-phenylene vinylene) films at the indium-tin oxide interface

被引:4
作者
Pocas, L. C. [2 ]
Nogueira, S. L. [1 ]
Nobuyasu, R. S. [1 ]
Dalkiranis, Gustavo G. [1 ]
Pires, M. J. M. [3 ]
Tozoni, Jose R. [1 ]
Silva, R. A. [1 ,3 ]
Marletta, Alexandre [1 ]
机构
[1] Univ Fed Uberlandia, Inst Fis, BR-38400902 Uberlandia, MG, Brazil
[2] Univ Tecnol Fed Parana UTFPR, BR-86812460 Apucarana, PR, Brazil
[3] Inst Nacl Metrol Normalizacao & Qualidade Ind, Div Metrol Mat, BR-25250020 Duque De Caxias, RJ, Brazil
关键词
LIGHT-EMITTING-DIODES; LOW-TEMPERATURES; PRECURSOR-ROUTE; DEVICES; SPECTRA;
D O I
10.1007/s10853-010-5119-7
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This article discusses a strategy to reduce the degradation of a poly(p-phenylene vinylene) (PPV) film at the interface with an indium-tin oxide (ITO) electrode. It consists of using a less aggressive leaving group, the sodium dodecylbenzenesulfonate salt (DBS), in the chemical synthesis of PPV starting with the polymer precursor, and performing the thermal conversion into PPV at a lower temperature (100 A degrees C) than in the conventional synthesis. The absorbance spectrum for an ITO/PPV + DBS film indicated that the polymer is less degraded and has the emission efficiency increased by ca. 4.5 times in comparison to ITO/PPV films obtained with the conventional procedures, i.e., with thermal conversion at 200 A degrees C, in vacuum, during 2 h. The main reason for the enhanced performance of the route reported in this article is a decrease in the oxygen concentration at the ITO/PPV interface, as inferred with X-ray Photoelectron Spectroscopy which corroborates the optical properties.
引用
收藏
页码:2644 / 2648
页数:5
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