Yield stability analysis in advanced durum wheat genotypes by using AMMI and GGE biplot models under diverse environment

A investigation was carried out to ascertain the GEI, the yield stability and adaptability of 17 advanced durum wheat genotypes (G) in four environments over two crop years (2011-12 and 2012-13) under rainfed and supplementary irrigation (IRR) conditions. Combined analysis of variance showed that environmental factor and GEI explained 70% and 10.71% of total sum squares, respectively. The AMMI and GGE biplot model were used to study the nature of GEI on the grain yield. First and second component of AMMI model totally explained 90.73% of GEI variations. Results of GGEbiplot model similar to the results of AMMI model showed that the G12 with the environment of IRR2, G2 with the environment of RA2 and G17 and G9 with the environment of RA1 and IRR1, respectively showed a special adaptability. G8 and G11 could be recommended for all environments. Considering both graphical analysis models of AMMI and GGEbiplot could be recommended. The ideal environment, according to AMMI model, was RA2, while GGEbiplot model represented IRR2 as ideal environment. The results indicated that AMMI and GGEbiplot are facilitated visual comparison and informative methods to detect genotypes stability and in the preferential genotypes recommendations.