Increase of island density via formation of secondary ordered islands on pit-patterned Si (001) substrates

被引:44
作者
Zhong, Z
Schmidt, OG
Bauer, G
机构
[1] Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany
[2] Johannes Kepler Univ, Inst Semicond Phys, A-4040 Linz, Austria
基金
奥地利科学基金会;
关键词
D O I
10.1063/1.2061870
中图分类号
O59 [应用物理学];
学科分类号
摘要
Site-controlled groups of Ge islands are grown on pit-patterned Si (001) substrates. By varying the deposited amount of Ge, we find that the growth starts with the formation of a single island at the pit bottom and then proceeds to the formation of a highly symmetric Ge island group around the pit top. A bimodal size distribution of dome-shaped islands at the bottom and at the top corners of the pits is observed. A growth mechanism is proposed to qualitatively explain these phenomena. Our experiments help to promote a further understanding of Ge island growth on patterned substrates. (C) 2005 American Institute of Physics.
引用
收藏
页码:1 / 3
页数:3
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