Experimental data and model simulations of beam spread in the environmental scanning electron microscope

被引:20
|
作者
Wight, SA [1 ]
机构
[1] Natl Inst Stand & Technol, Surface & Microanal Sci Div, Gaithersburg, MD 20899 USA
关键词
environmental scanning electron microscope; electron microscope; beam spread; electron scattering; skirt; Monte Carlo; model; simulation;
D O I
10.1002/sca.4950230505
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
This work describes the comparison of experimental measurements of electron beam spread in the environmental scanning electron microscope with model predictions. Beam spreading is the result of primary electrons being scattered out of the focused beam by interaction with gas molecules in the low-vacuum specimen chamber. The scattered electrons form a skirt of electrons around the central probe. The intensity of the skirt depends on gas pressure in the chamber, beam-gas path length, beam energy, and gas composition. A model has been independently developed that, under a given set of conditions, predicts the radial intensity distribution of the scattered electrons. Experimental measurements of the intensity of the beam skirt were made under controlled conditions for comparison with model predictions of beam skirting. The model predicts the trends observed in the experimentally determined scattering intensities; however, there does appear to be a systematic deviation from the experimental measurements.
引用
收藏
页码:320 / 327
页数:8
相关论文
共 50 条
  • [1] Optimum beam transfer in the environmental scanning electron microscope
    Danilatos, G. D.
    JOURNAL OF MICROSCOPY, 2009, 234 (01) : 26 - 37
  • [2] Direct measurement of electron beam scattering in the environmental scanning electron microscope using phosphor imaging plates
    Wight, SA
    Zeissler, CJ
    SCANNING, 2000, 22 (03) : 167 - 172
  • [3] Electron beam current loss at the high-vacuum-high-pressure boundary in the environmental scanning electron microscope
    Danilatos, GD
    Phillips, MR
    Nailon, JV
    MICROSCOPY AND MICROANALYSIS, 2001, 7 (05) : 397 - 406
  • [4] The effect of beam diameter on the electron skirt in a high pressure scanning electron microscope
    Belkorissat, R
    Kadoun, A
    Khelifa, B
    Mathieu, C
    MICRON, 2004, 35 (07) : 543 - 547
  • [5] Hyaline cartilage surface study with an environmental scanning electron microscope. An experimental study
    S. Sastre
    S. Suso
    J. M. Segur
    G. Bori
    J. A. Carbonell
    E. Agustí
    M. Nuñez
    Journal of Materials Science: Materials in Medicine, 2009, 20 : 2181 - 2187
  • [6] Latex Film Formation in the Environmental Scanning Electron Microscope
    Dragnevski, Kalin
    Donald, Athene
    Taylor, Phil
    Murray, Martin
    Davies, Simon
    Bone, Elizabeth
    MACROMOLECULAR SYMPOSIA, 2009, 281 : 119 - 125
  • [7] Application of an environmental scanning electron microscope to micromechanical fabrication
    Paul, BK
    Klimkiewicz, M
    SCANNING, 1996, 18 (07) : 490 - 496
  • [8] Applications of the environmental scanning electron microscope to the analysis of pharmaceutical formulations
    DEmanuele, A
    Gilpin, C
    SCANNING, 1996, 18 (07) : 522 - 527
  • [9] Micromanipulation of spherical particles during condensation and evaporation of water in an environmental scanning electron microscope
    Schroeter, Felix
    Schmidt, Eberhard
    POWDER TECHNOLOGY, 2018, 330 : 80 - 92
  • [10] A new method for low-magnification in the environmental scanning electron microscope
    Taylor, ME
    Wight, SA
    SCANNING, 1996, 18 (07) : 483 - 489