Practical limitations of subwavelength resolution using negative-refractive-index transmission-line lenses

被引:29
|
作者
Grbic, A [1 ]
Eleftheriades, GV [1 ]
机构
[1] Univ Toronto, Dept Elect & Comp Engn, Toronto, ON M5S 3G4, Canada
关键词
diffraction limit; left-handed; metarnaterials; negative refractive index; plasmons; superresolution; transmission lines (TLs);
D O I
10.1109/TAP.2005.856316
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Previously, we have demonstrated both analytically and experimentally subwavelength imaging using a negative-refractive-index lens made of a periodically L, C loaded transmission line (TL) network. This loaded transmission line network has been referred to as the dual TL lens. Here, we consider the limitations on subwavelength imaging imposed by impedance mismatches and the component losses of a practical dual TL lens. Simple expressions for estimating the resolving capability of a dual TL lens are given. It is found that the resolution enhancement of the dual lens is proportional to the quality factor of the series loading capacitors divided by the electrical thickness of the lens. The effective material parameters of the dual TL lens are also derived so that these expressions can be directly related to those of previous studies considering uniform and isotropic left-handed lenses. Finally, the resolving capability of an experimental lens that achieves subwavelength imaging is theoretically predicted. These theoretical predictions are then directly compared to previously reported experimental results.
引用
收藏
页码:3201 / 3209
页数:9
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