Prospects of X-ray imaging spectrometers for impurity transport: Recent results from the stellarator Wendelstein 7-X (invited)

被引:37
作者
Langenberg, A. [1 ]
Pablant, N. A. [2 ]
Wegner, Th [1 ]
Traverso, P. [3 ]
Marchuk, O. [4 ]
Braeuer, T. [1 ]
Geiger, B. [1 ]
Fuchert, G. [1 ]
Bozhenkov, S. [1 ]
Pasch, E. [1 ]
Grulke, O. [1 ,4 ]
Kunkel, F. [1 ]
Killer, C. [1 ]
Nicolai, D. [5 ]
Satheeswaran, G. [5 ]
Hollfeld, K. P. [5 ]
Schweer, B. [5 ]
Krings, T. [5 ]
Drews, P. [5 ]
Offermanns, G. [5 ]
Pavone, A. [1 ]
Svensson, J. [1 ]
Alonso, J. A. [6 ]
Burhenn, R. [1 ]
Wolf, R. C. [1 ]
机构
[1] Max Planck Inst Plasma Phys, D-17491 Greifswald, Germany
[2] Princeton Plasma Phys Lab, POB 451, Princeton, NJ 08543 USA
[3] Auburn Univ, Auburn, AL 36849 USA
[4] Tech Univ Denmark DTU, Dept Phys, PPFE, DK-2800 Lyngby, Denmark
[5] Forschungszentrum Julich, Inst Energie & Klimaforsch Plasmaphys, D-52425 Julich, Germany
[6] Asociac EURATOM CIEMAT, Lab Nacl Fus, Madrid, Spain
关键词
PLASMAS; ARGON;
D O I
10.1063/1.5036536
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
This paper reports on the design and the performance of the recently upgraded X-ray imaging spectrometer systems, X-ray imaging crystal spectrometer and high resolution X-ray imaging spectrometer, installed at the optimized stellarator Wendelstein 7-X. High resolution spectra of highly ionized, He-like Si, Ar, Ti, and Fe as well as H-like Ar have been observed. A cross comparison of ion and electron temperature profiles derived from a spectral fit and tomographic inversion of Ar and Fe spectra shows a reasonable match with both the spectrometers. The also measured impurity density profiles of Ar and Fe have peaked densities at radial positions that are in qualitative agreement with the expectations from the He-like impurity fractional abundances, given the measured temperature profiles. Repeated measurements of impurity decay times have been demonstrated with an accuracy of 1 ms via injection of non-recycling Ti, Fe, and Mo impurities using a laser blow-off system.
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页数:7
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