Computation of the short-term flicker severity index

被引：15

作者：

Keppler, T ^{[1
]}

Watson, N ^{[1
]}

Arrillaga, J ^{[1
]}

机构：

[1] Univ Canterbury, Dept Elect & Elect Engn, Christchurch 1, New Zealand

来源：

IEEE TRANSACTIONS ON POWER DELIVERY | 2000年 / 15卷 / 04期

关键词：

electric power quality; flickermeter; flicker severity;

D O I：

10.1109/61.891490

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Short-term flicker severity (P-st) is an important electric power quality index defined by the International Electrotechnical Commission (IEC), P-st results from the statistical evaluation of flicker over short periods of time producing an objective measure for flicker originating from various types of sources. This paper reviews previous methods for computing P-st and proposes a new iterative algorithm. The algorithm is computationally efficient and shown to comply with the IEC standard.

引用

页码：1110 / 1115

页数：6