Photothermoplastic recording of half-tone images: Technological studies of the minimization of the defects of an information medium

被引：5
作者：
Cherkasov, YA
Aleksandrova, EL
Zakharova, NB
机构：
[1] SI Vavilov State Opt Inst, St Petersburg, Russia
[2] Elektron Sci Mfg Org, St Petersburg, Russia
来源：
JOURNAL OF OPTICAL TECHNOLOGY | 1999年 / 66卷 / 01期
关键词：
D O I：
10.1364/JOT.66.000027
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A process has been developed for low-defect high-resolution photothermoplastic materials for aerospace picture-taking, based on high-sensitivity CdSe and SeAsTe films on a rigid substrate with a compact structure, including an internal optical raster with a frequency of 100-600 mm(-1), a thermal-developing transparent electrode, and separated optical input and output. The process can be used to create detectors of the CCD-array type, with up to 40 000 X 40 000 pixels. (C) 1999 The Optical Society of America. [S1070-9762(99)00601-6].
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页码：27 / 33
页数：7
相关论文
共 20 条
[1]  
BORODKINA MS, Patent No. 667950
[2]  
BUROV PA, Patent No. 2015518
[3]  
Cherkasov YA, 1996, J OPT TECHNOL+, V63, P308
[4]  
Cherkasov YA, 1996, J OPT TECHNOL+, V63, P317
[5]  
Cherkasov YA, 1996, J OPT TECHNOL+, V63, P324
[6]  
CHERKASOV YA, 1997, P SOC PHOTO-OPT INS, V3347, P101
[7]  
CHERKASOV YA, 1998, IN PRESS ZH NAUCHN P, V43
[8]  
CHERKASOV YA, Patent No. 1665336
[9]  
CHERKASOV YA, 1984, SILVER FREE PHOTOGRA, P45
[10]  
DYACHENKO NV, 1991, ZH NAUCH PRIKL FOTOG, V36, P165
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