Fundamental studies of halogen reactions with III-V semiconductor surfaces

被引:59
作者
Simpson, WC
Yarmoff, JA
机构
[1] UNIV CALIF RIVERSIDE, DEPT PHYS, RIVERSIDE, CA 92521 USA
[2] UNIV CALIF BERKELEY, LAWRENCE BERKELEY LAB, DIV SCI MAT, BERKELEY, CA 94720 USA
关键词
semiconductor processing; gallium arsenide; chlorine; fluorine; etching;
D O I
10.1146/annurev.physchem.47.1.527
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
It is technologically important to understand how halogens react with semiconductor surfaces because halogen compounds are commonly used to etch semiconductor wafers in the microelectronics industry. Halogens are also model adsorbates for studying chemisorption on covalently bonded materials, such as semiconductors, owing to the simple nature of the bonds that they form. The growing use of III-V materials in the manufacture of optoelectronic devices has prompted investigations of the reactions of molecular halogens (XeF2, Cl-2, Br-2, and I-2) with III-V semiconductor surfaces (GaAs, GaSb, InP, InAs, and InSb). This review examines the more fundamental of these investigations, which involve model systems in ultra-high vacuum, focusing on the chemistry of the halogen surface reactions and the physical and electronic structure of the reacted surfaces.
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页码:527 / 554
页数:28
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