Nanofocusing of hard X-ray free electron laser pulses using diamond based Fresnel zone plates

被引:111
作者
David, C. [1 ]
Gorelick, S. [1 ]
Rutishauser, S. [1 ]
Krzywinski, J. [2 ]
Vila-Comamala, J. [1 ]
Guzenko, V. A. [1 ]
Bunk, O. [1 ]
Farm, E. [3 ]
Ritala, M. [3 ]
Cammarata, M. [2 ]
Fritz, D. M. [2 ]
Barrett, R. [4 ]
Samoylova, L. [5 ]
Gruenert, J. [5 ]
Sinn, H. [5 ]
机构
[1] Paul Scherrer Inst, CH-5232 Villigen, Switzerland
[2] SLAC Natl Accelerator Lab, Menlo Pk, CA 94025 USA
[3] Univ Helsinki, Dept Chem, FI-00014 Helsinki, Finland
[4] European Synchrotron Radiat Facil, F-38000 Grenoble, France
[5] European XFEL, D-22607 Hamburg, Germany
关键词
RESOLUTION; OPTICS;
D O I
10.1038/srep00057
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
A growing number of X-ray sources based on the free-electron laser (XFEL) principle are presently under construction or have recently started operation. The intense, ultrashort pulses of these sources will enable new insights in many different fields of science. A key problem is to provide x-ray optical elements capable of collecting the largest possible fraction of the radiation and to focus into the smallest possible focus. As a key step towards this goal, we demonstrate here the first nanofocusing of hard XFEL pulses. We developed diamond based Fresnel zone plates capable of withstanding the full beam of the world's most powerful x-ray laser. Using an imprint technique, we measured the focal spot size, which was limited to 320 nm FWHM by the spectral band width of the source. A peak power density in the focal spot of 4x10(17) W/cm(2) was obtained at 70 fs pulse length.
引用
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页数:5
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