Neutron reflectometry on interfacial structures of the thin films of polymer and lipid

被引:32
作者
Torikai, Naoya [1 ]
Yamada, Norifumi L. [1 ]
Noro, Atsushi [2 ]
Harada, Masashi [2 ]
Kawaguchi, Daisuke [2 ]
Takano, Atsushi [2 ]
Matsushita, Yushu [2 ]
机构
[1] High Energy Accelerator Res Org, Inst Mat Struct Sci, Tsukuba, Ibaraki 3050801, Japan
[2] Nagoya Univ, Grad Sch Engn, Dept Appl Chem, Chikusa Ku, Nagoya, Aichi 4648603, Japan
关键词
neutron reflectometry; high depth resolution; soft-material; deuterium labeling; non-destructive exploration; deeply-buried interface; in situ measurement;
D O I
10.1295/polymj.PJ2007113
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
Neutron reflectometry is a very powerful and essential technique for the studies on material interfaces due to its high spatial resolution, similar to a few tenths of nm, along the depth direction. The use of neutron as a probe is a big advantage for structural analysis on soft-materials, since the scattering contrast can be highly enhanced in hydrogenous materials such as polymers, surfactants, lipids, proteins, etc., without big changes in their physical and chemical properties by substituting all or part of the hydrogen atoms in the molecules with deuterium (a deuterium labeling method). Furthermore, the neutron reflectometry can explore deeply-buried interfaces such as solid/liquid interfaces in a non-destructive way, and make in situ measurements combined with various sample environments due to its high transmission to the materials. In this article, the neutron reflectometry is reviewed from the standpoint of researches on interfacial structures of the thin films of polymer and lipid, and its future prospects at a high-intensity pulsed-neutron source are presented.
引用
收藏
页码:1238 / 1246
页数:9
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