The microXAS beamline at the Swiss Light source: towards nano-scale imaging

被引：40

作者：

Borca, C. N. ^{[1
]}

Grolimund, D. ^{[1
]}

Willimann, M. ^{[1
]}

Meyer, B. ^{[1
]}

Jefimovs, K. ^{[1
]}

Vila-Comamala, J. ^{[1
]}

David, C. ^{[1
]}

机构：

[1] Paul Scherrer Inst, CH-5232 Villigen, Switzerland

来源：

9TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY | 2009年 / 186卷

关键词：

D O I：

10.1088/1742-6596/186/1/012003

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The microXAS beamline is a dedicated hard X-ray microprobe facility allowing a combination of fluorescence, spectroscopy and diffraction techniques in an energy scale from 4 to 23 keV. This paper presents a short review of the beamline, including the recent developments towards nano-scale imaging.

引用

页数：3

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