Progress in MOS-controlled bipolar devices and edge termination technologies

被引:3
|
作者
Narayanan, EMS [1 ]
Spulber, O [1 ]
Sweet, M [1 ]
Bose, JVSC [1 ]
Verchinine, K [1 ]
Luther-King, N [1 ]
Moguilnaia, N [1 ]
De Souza, MM [1 ]
机构
[1] De Montfort Univ, Emerging Technol Res Ctr, Leicester LE1 9BH, Leics, England
关键词
insulated gate bipolar transistor; semiconductor; thyristors;
D O I
10.1016/S0026-2692(03)00186-1
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An overview of the recent developments in high-voltage power semiconductor MOS-controlled bipolar devices is presented. The Insulated Gate Bipolar Transistor (IGBT) technology is explored from its initial stage up to the latest state-of-the-art developments, in terms of cathode engineering, drift design and anode engineering to highlight the different approaches used for optimisation and the achieved trade-offs. Further, several MOS-gated thyristors, which are aimed to replace the IGBT, are analysed. Moreover, the present paper reviews the various approaches in the fabrication of edge termination used in power device MOS-controlled bipolar devices. (C) 2003 Elsevier Ltd. All rights reserved.
引用
收藏
页码:235 / 248
页数:14
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