Theoretical prediction of eliminating the buffer layer and achieving charge neutrality for epitaxial graphene on 6H-SiC(0001) via boron compound intercalations

被引:5
作者
Luo, Xingyun [1 ,2 ]
Sun, Xiucai [1 ,2 ]
Li, Yanlu [1 ,2 ]
Yu, Fapeng [1 ,2 ,3 ]
Sun, Li [1 ,2 ]
Cheng, Xiufeng [1 ,2 ]
Zhao, Xian [1 ,2 ,3 ]
机构
[1] Shandong Univ, State Key Lab Crystal Mat, Jinan 250100, Peoples R China
[2] Shandong Univ, Inst Crystal Mat, Jinan 250100, Peoples R China
[3] Shandong Univ, Ctr Opt Res & Engn Shandong Univ, Jinan 250100, Peoples R China
关键词
GENERALIZED GRADIENT APPROXIMATION; CHEMICAL-VAPOR-DEPOSITION; TOTAL-ENERGY CALCULATIONS; ELECTRONIC-STRUCTURE; TRANSISTORS; PRESSURE; CRYSTAL; SILICON;
D O I
10.1016/j.carbon.2020.01.095
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Charge neutrality is vital to improve the performance of electronic devices based on epitaxial graphene grown on SiC substrates. First-principle calculations are applied to predict the charge-neutral epitaxial graphene by intercalating B3C5 layer between the SiC substrate and a buffer carbon layer. The electronic structure of graphene is found to be modulated by adjusting the B:C ratio of a series of BxCy intercalation layers. The buffer layer is eliminated and the intrinsic n-doping of as-grown graphene is avoided by preventing the charge transfer between graphene and the SiC substrate. The calculated surface energy of the B3C5-intercalated structure shows considerable stability as compared to the other intercalated structures over a wide range of temperatures and pressures under B-rich conditions. These findings will promote the practical application of B3C5-intercalated epitaxial graphene on SiC(0001) as a core element of microelectronic devices at high temperature, or pressure sensors at variable pressure conditions. (C) 2020 Elsevier Ltd. All rights reserved.
引用
收藏
页码:323 / 330
页数:8
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