Improved PECVD processed hydrogenated germanium films through temperature induced densification

被引:7
作者
de Vrijer, Thierry [1 ]
van Dingen, Julian E. C. [1 ]
Roelandschap, Paul J. [1 ]
Roodenburg, Koos [1 ]
Smets, Arno H. M. [1 ]
机构
[1] Delft Univ Technol, Photovolta Mat & Devices, Mekelweg 4, NL-2628 CD Delft, Netherlands
关键词
PECVD; Amorphous germanium; Hydrogenated germanium; Temperature densification; Thin film; Chemical stability; REFRACTIVE-INDEX; SILICON-OXIDE; ELECTRONIC-PROPERTIES; AMORPHOUS-GERMANIUM; GLOW-DISCHARGE; THIN-FILMS; DENSITY; GE; DEPOSITION; SURFACE;
D O I
10.1016/j.mssp.2021.106285
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Amorphous and nano-crystalline germanium is of potential interest for a wide range of electronic, optical, optoelectronic and photovoltaic applications. In this work the influence of deposition temperature on hydrogenated germanium (Ge:H) films was characterized, using over 200 Ge:H and over 70 SiGe:H films. The demonstrated temperature-induced densification of Ge:H films resulted in more stable films with a lower bandgap energy and dark conductivity and higher activation energy.
引用
收藏
页数:7
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