Ptychographic imaging for the characterization of X-ray free-electron laser beams

被引：3
作者：
Sala, S. [1 ,2 ,3 ]
Daurer, B. J. [4 ]
Hantke, M. F. [4 ]
Ekeberg, T. [4 ]
Loh, N. D. [5 ]
Maia, F. R. N. C. [4 ]
Thibault, P. [3 ]
机构：
[1] UCL, Dept Phys & Astron, London WC1E 6BT, England
[2] Diamond Light Source, Harwell Sci & Innovat Campus, Didcot OX11 O0E, Oxon, England
[3] Univ Southampton, Dept Phys & Astron, Southampton SO17 1BJ, Hants, England
[4] Uppsala Univ, Dept Cell & Mol Biol, S-75124 Uppsala, Sweden
[5] Natl Univ Singapore, Dept Phys, Singapore 117551, Singapore
来源：
X-RAY MICROSCOPY CONFERENCE 2016 (XRM 2016) | 2017年 / 849卷
基金：
瑞典研究理事会; 欧洲研究理事会;
关键词：
COHERENT; SCATTERING; FOCUS;
D O I：
10.1088/1742-6596/849/1/012032
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
We present some preliminary results from a study aimed at the characterization of the wavefront of X-ray free electron laser (XFEL) beams in the same operation conditions as for single particle imaging (or flash X-ray imaging) experiments. The varying illumination produced by wavefront fluctuations between several pulses leads to a partially coherent average beam which can be decomposed into several coherent modes using ptychographic reconstruction algorithms. Such a decomposition can give insight into pulse-to-pulse variations of the wavefront. We discuss data collected at the Linac Coherent Light Source (LCLS) and FERMI.
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页数：4
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