Fabrication and characterization of silicon based thermal neutron detector with hot wire chemical vapor deposited boron carbide converter
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作者:
Chaudhari, Pradip
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Indian Inst Technol, Dept Met Engn & Mat Sci, Semicond Thin Films & Plasma Proc Lab, Bombay 400076, Maharashtra, IndiaIndian Inst Technol, Dept Met Engn & Mat Sci, Semicond Thin Films & Plasma Proc Lab, Bombay 400076, Maharashtra, India
Chaudhari, Pradip
[1
]
Singh, Arvind
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Bhabha Atom Res Ctr, Div Elect, Bombay 400085, Maharashtra, IndiaIndian Inst Technol, Dept Met Engn & Mat Sci, Semicond Thin Films & Plasma Proc Lab, Bombay 400076, Maharashtra, India
Singh, Arvind
[2
]
Topkar, Anita
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Bhabha Atom Res Ctr, Div Elect, Bombay 400085, Maharashtra, IndiaIndian Inst Technol, Dept Met Engn & Mat Sci, Semicond Thin Films & Plasma Proc Lab, Bombay 400076, Maharashtra, India
Topkar, Anita
[2
]
Dusane, Rajiv
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Indian Inst Technol, Dept Met Engn & Mat Sci, Semicond Thin Films & Plasma Proc Lab, Bombay 400076, Maharashtra, IndiaIndian Inst Technol, Dept Met Engn & Mat Sci, Semicond Thin Films & Plasma Proc Lab, Bombay 400076, Maharashtra, India
Dusane, Rajiv
[1
]
机构:
[1] Indian Inst Technol, Dept Met Engn & Mat Sci, Semicond Thin Films & Plasma Proc Lab, Bombay 400076, Maharashtra, India
[2] Bhabha Atom Res Ctr, Div Elect, Bombay 400085, Maharashtra, India
In order to utilize the well established silicon detector technology for neutron detection application, a silicon based thermal neutron detector was fabricated by integrating a thin boron carbide layer as a neutron converter with a silicon PIN detector. Hot wire chemical vapor deposition (HWCVD), which is a low cost, low temperature process for deposition of thin films with precise thickness was explored as a technique for direct deposition of a boron carbide layer over the metalized front surface of the detector chip. The presence of B-C bonding and B-10 isotope in the boron carbide film were confirmed by Fourier transform infrared spectroscopy and secondary ion mass spectrometry respectively. The deposition of HWCVD boron carbide layer being a low temperature process was observed not to cause degradation of the PIN detector. The response of the detector with 0.2 mu m and 0.5 mu m thick boron carbide layer was examined in a nuclear reactor. The pulse height spectrum shows evidence of thermal neutron response with signature of (n, a) reaction. The results presented in this article indicate that HWCVD boron carbide deposition technique would be suitable for low cost industrial fabrication of PIN based single element or 1D/2D position sensitive thermal neutron detectors. (C) 2015 Elsevier B.V. All rights reserved,
机构:
Indian Inst Technol, Dept Met Engn & Mat Sci, Bombay 400076, Maharashtra, IndiaIndian Inst Technol, Dept Met Engn & Mat Sci, Bombay 400076, Maharashtra, India
Chaudhari, Pradip
;
Meshram, Nagsen
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Indian Inst Technol, Dept Met Engn & Mat Sci, Bombay 400076, Maharashtra, IndiaIndian Inst Technol, Dept Met Engn & Mat Sci, Bombay 400076, Maharashtra, India
Meshram, Nagsen
;
Singh, Arvind
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机构:
Bhabha Atom Res Ctr, Div Elect, Bombay 400085, Maharashtra, IndiaIndian Inst Technol, Dept Met Engn & Mat Sci, Bombay 400076, Maharashtra, India
Singh, Arvind
;
Topkar, Anita
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h-index: 0
机构:
Bhabha Atom Res Ctr, Div Elect, Bombay 400085, Maharashtra, IndiaIndian Inst Technol, Dept Met Engn & Mat Sci, Bombay 400076, Maharashtra, India
Topkar, Anita
;
Dusane, Rajiv
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Indian Inst Technol, Dept Met Engn & Mat Sci, Bombay 400076, Maharashtra, IndiaIndian Inst Technol, Dept Met Engn & Mat Sci, Bombay 400076, Maharashtra, India
机构:
Indian Inst Technol, Dept Met Engn & Mat Sci, Bombay 400076, Maharashtra, IndiaIndian Inst Technol, Dept Met Engn & Mat Sci, Bombay 400076, Maharashtra, India
Chaudhari, Pradip
;
Meshram, Nagsen
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h-index: 0
机构:
Indian Inst Technol, Dept Met Engn & Mat Sci, Bombay 400076, Maharashtra, IndiaIndian Inst Technol, Dept Met Engn & Mat Sci, Bombay 400076, Maharashtra, India
Meshram, Nagsen
;
Singh, Arvind
论文数: 0引用数: 0
h-index: 0
机构:
Bhabha Atom Res Ctr, Div Elect, Bombay 400085, Maharashtra, IndiaIndian Inst Technol, Dept Met Engn & Mat Sci, Bombay 400076, Maharashtra, India
Singh, Arvind
;
Topkar, Anita
论文数: 0引用数: 0
h-index: 0
机构:
Bhabha Atom Res Ctr, Div Elect, Bombay 400085, Maharashtra, IndiaIndian Inst Technol, Dept Met Engn & Mat Sci, Bombay 400076, Maharashtra, India
Topkar, Anita
;
Dusane, Rajiv
论文数: 0引用数: 0
h-index: 0
机构:
Indian Inst Technol, Dept Met Engn & Mat Sci, Bombay 400076, Maharashtra, IndiaIndian Inst Technol, Dept Met Engn & Mat Sci, Bombay 400076, Maharashtra, India