Multivariate analysis for scanning tunneling spectroscopy data

被引:2
|
作者
Yamanishi, Junsuke [1 ]
Iwase, Shigeru [2 ]
Ishida, Nobuyuki [3 ]
Fujita, Daisuke [3 ]
机构
[1] Osaka Univ, Dept Appl Phys, 2-2 Yamadaoka, Suita, Osaka 5650871, Japan
[2] Univ Tsukuba, Grad Sch Pure & Appl Sci, 1-1-1 Tennodai, Tsukuba, Ibaraki 3058571, Japan
[3] Natl Inst Mat Sci, 1-2-1 Sengen, Tsukuba, Ibaraki 3050047, Japan
关键词
Scanning tunneling microscopy; Multivariate analysis; Principal component analysisa; PRINCIPAL COMPONENT ANALYSIS; SI(111)2X1 SURFACE; MICROSCOPY; DECOMPOSITION; NOISE;
D O I
10.1016/j.apsusc.2017.09.124
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We applied principal component analysis (PCA) to two-dimensional tunneling spectroscopy (2DTS) data obtained on a Si(111)-(7 x 7) surface to explore the effectiveness of multivariate analysis for interpreting 2DTS data. We demonstrated that several components that originated mainly from specific atoms at the Si(111)-(7 x 7) surface can be extracted by PCA. Furthermore, we showed that hidden components in the tunneling spectra can be decomposed (peak separation), which is difficult to achieve with normal 2DTS analysis without the support of theoretical calculations. Our analysis showed that multivariate analysis can be an additional powerful way to analyze 2DTS data and extract hidden information from a large amount of spectroscopic data. (C) 2017 Elsevier B.V. All rights reserved.
引用
收藏
页码:186 / 190
页数:5
相关论文
共 50 条
  • [31] Scanning tunneling spectroscopy on clean and contaminated V(001)
    Bischoff, MMJ
    Konvicka, C
    Quinn, AJ
    Schmid, M
    Redinger, J
    Podloucky, R
    Varga, P
    van Kempen, H
    SURFACE SCIENCE, 2002, 513 (01) : 9 - 25
  • [32] Scanning tunneling spectroscopy of epitaxial silver indium diselenide
    Martin, Pamela Pena
    Lyding, Joseph
    Rockett, Angus
    SURFACE SCIENCE, 2015, 636 : 8 - 12
  • [33] An applicability of scanning tunneling microscopy for surface electron spectroscopy
    Tomitori, M
    Hirade, M
    Suganuma, Y
    Arai, T
    SURFACE SCIENCE, 2001, 493 (1-3) : 49 - 55
  • [34] Scanning tunneling microscopy and spectroscopy investigations of QCA molecules
    Manimaran, M
    Snider, GL
    Lent, CS
    Sarveswaran, V
    Lieberman, M
    Li, ZH
    Fehlner, TP
    ULTRAMICROSCOPY, 2003, 97 (1-4) : 55 - 63
  • [35] Surface characterization of Al-Cu-Fe thin films by scanning tunneling microscopy and scanning tunneling spectroscopy
    Srinivas, V
    Kasiviswanathan, S
    Barua, P
    Mathur, BK
    APPLIED SURFACE SCIENCE, 1999, 147 (1-4) : 140 - 145
  • [36] Revealing the Chemical Bonding in Adatom Arrays via Machine Learning of Hyperspectral Scanning Tunneling Spectroscopy Data
    Roccapriore, Kevin M.
    Zou, Qiang
    Zhang, Lizhi
    Xue, Rui
    Yan, Jiaqiang
    Ziatdinov, Maxim
    Fu, Mingming
    Mandrus, David G.
    Yoon, Mina
    Sumpter, Bobby G.
    Gai, Zheng
    Kalinin, Sergei, V
    ACS NANO, 2021, 15 (07) : 11806 - 11816
  • [37] Optical spectroscopy and scanning tunneling microscopy of thin films of the metal-tetracyanoquinodimethane derivatives
    Yamaguchi, S
    Potember, RS
    SYNTHETIC METALS, 1996, 78 (02) : 117 - 126
  • [38] Deconvolution of the electronic density of states of tip and sample from scanning tunneling spectroscopy data: Proof of principle
    Koslowski, B.
    Pfeifer, H.
    Ziemann, P.
    PHYSICAL REVIEW B, 2009, 80 (16):
  • [39] Imaging of Ti0.87O2 nanosheets using scanning tunneling spectroscopy
    Kumar, Avijit
    Palanisamy, Suresh Kumar C.
    Boter, Jelmer M.
    Hellenthal, Chris
    ten Elshof, Johan E.
    Zandvliet, Harold J. W.
    APPLIED SURFACE SCIENCE, 2013, 265 : 201 - 204
  • [40] Circuit analysis of an ultrafast junction mixing scanning tunneling microscope
    Steeves, GM
    Elezzabi, AY
    Teshima, R
    Said, RA
    Freeman, MR
    IEEE JOURNAL OF QUANTUM ELECTRONICS, 1998, 34 (08) : 1415 - 1418