multilayers;
perpendicular magnetic recording;
amorphous carbon underlayer;
D O I:
10.1016/S0304-8853(01)00305-5
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
The effect of amorphous carbon underlayer thickness on the microstructure of the CO/Pd multilayer perpendicular magnetic recording media was investigated. From the magnetic force microscopy observation in the AC-demagnetized state of the Co/Pd multilayer media, the magnetic cluster size was observed to effectively decrease with an increase in carbon underlayer thickness, where the higher coercivity and the higher SIN ratio of the Co/Pd multilayer media were obtained with the thicker underlayer. Furthermore, the distribution of [111] orientation of FCC-Pd became broader, and the grain size decreased with an increase in the carbon underlayer thickness. These effects caused the magnetic exchange decoupling of Co/Pd multilayer media. We suggested that the change of microstructure was directly related to the surface roughness of the amorphous carbon underlayer. (C) 2001 Elsevier Science B.V. All rights reserved.
机构:
Korea Adv Inst Sci & Technol, Dept Mat Sci & Engn, Taejon 305701, South KoreaKorea Adv Inst Sci & Technol, Dept Mat Sci & Engn, Taejon 305701, South Korea
Tahk, YW
Lee, SC
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机构:Korea Adv Inst Sci & Technol, Dept Mat Sci & Engn, Taejon 305701, South Korea
Lee, SC
Hong, DH
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机构:Korea Adv Inst Sci & Technol, Dept Mat Sci & Engn, Taejon 305701, South Korea
Hong, DH
Hong, SY
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机构:Korea Adv Inst Sci & Technol, Dept Mat Sci & Engn, Taejon 305701, South Korea
Hong, SY
Lee, TD
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h-index: 0
机构:Korea Adv Inst Sci & Technol, Dept Mat Sci & Engn, Taejon 305701, South Korea