Titanium infiltration into ultrathin PMMA brushes

被引:2
作者
Giovanni Mani-Gonzalez, Pierre [1 ]
McFeely, Caitlin [2 ]
Snelgrove, Matthew [2 ]
Shiel, Kyle [2 ]
Hernandez Marquez, Jesus Alfredo [1 ]
O'Connor, Robert [2 ,3 ]
机构
[1] Autonomous Univ Ciudad Juarez, Inst Engn & Technol, Dept Phys & Math, Cd Juarez 32310, Mexico
[2] Dublin City Univ, Sch Phys Sci, Dublin 9, Ireland
[3] Dublin City Univ, Adv Proc Technol Ctr, Dublin 9, Ireland
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 2021年 / 39卷 / 04期
基金
爱尔兰科学基金会;
关键词
BLOCK-COPOLYMER LITHOGRAPHY; ATOMIC LAYER DEPOSITION; TRIMETHYLALUMINUM;
D O I
10.1116/6.0001061
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Vapor phase infiltration (VPI) is a bottom-up process that involves the infiltration of polymers, often using atomic layer deposition compatible precursors. By exposing a polymer to an organo-metallic precursor, area selective material formation is achieved where the precursor reacts with regions covered by an infiltration-receptive polymer brush. Combining receptive and rejecting polymers that have the capability of forming complex nanopatterns could potentially allow for the creation of nanofeatures, offering a route to area selective deposition. This work is concerned with the creation and characterization of titanium-infiltrated films with a VPI process. Thin films of poly(methyl methacrylate) (PMMA) were infused with titanium isopropoxide and subsequently analyzed with angular resolved x-ray photoelectron spectroscopy. All XPS analysis and VPI treatments were completed without breaking vacuum in an integrated ultrahigh vacuum setup, with O 1s, C 1s, Ti 2p, and Si 2p core levels revealing the successful incorporation of titanium into the polymer. Grazing angle Fourier-transform infrared spectroscopy demonstrates the breaking of carbon-oxygen double bonds within the PMMA structure due to titanium incorporation. Published under an exclusive license by the AVS.
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页数:4
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