Finite element analysis for complex permittivity measurement of a dielectric plate and its application to inverse problem

被引：6
作者：
Hirayama, K [1 ]
Hayashi, Y [1 ]
机构：
[1] Kitami Inst Technol, Dept Elect & Elect Engn, Kitami, Hokkaido 0908507, Japan
来源：
ELECTRONICS AND COMMUNICATIONS IN JAPAN PART II-ELECTRONICS | 2001年 / 84卷 / 05期
关键词：
complex permittivity measurement; cylindrical cavity resonator; axisymmetric finite element method; inverse problem; Newton method;
D O I：
10.1002/ecjb.1024.abs
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The resonant frequency and unloaded quality factor of a cylindrical cavity resonator are computed accurately by using the axisymmetric finite element method. Here the loss of both a dielectric sample and a shielding conductor is taken into account. A term with 1/r among the components of the finite element matrix is analytically integrated over a triangular ring quadratic element. Also, the inverse problem, that is, the estimation of the complex permittivity of a dielectric from a resonant frequency and an unloaded quality factor, is formulated and its usefulness is confirmed through some computed results for dielectric plates and deformed lossy sheets. (C) 2001 Scripts Technica.
引用
收藏
页码：10 / 19
页数：10
相关论文
共 27 条
  • [1] ABE T, 1997 GEN C
  • [2] ABE T, 1988, T IEE JAPAN, V118, P1043
  • [3] DETERMINATION OF THE EIGENFREQUENCIES OF A FERRITE-FILLED CYLINDRICAL CAVITY RESONATOR USING THE FINITE-ELEMENT METHOD
    CHINN, GC
    EPP, LW
    WILKINS, GM
    [J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1995, 43 (05) : 1207 - 1209
  • [4] SPARSE-MATRIX EIGENVALUE SOLVER FOR FINITE-ELEMENT SOLUTION OF DIELECTRIC WAVE-GUIDES
    FERNANDEZ, FA
    DAVIES, JB
    ZHU, S
    LU, Y
    [J]. ELECTRONICS LETTERS, 1991, 27 (20) : 1824 - 1826
  • [5] FUJISAWA K, 1972, MICROWAVE CIRCUITS, P120
  • [6] GIL FH, 1985, IEEE T MICROW THEORY, V33, P1453
  • [7] Hashimoto O., 1996, Transactions of the Institute of Electronics, Information and Communication Engineers B-II, VJ79B-II, P616
  • [8] Hashimoto O., 1997, Transactions of the Institute of Electrical Engineers of Japan, Part A, V117-A, P456
  • [9] Inoue K., 1989, Transactions of the Institute of Electronics, Information and Communication Engineers C-I, V72C-I, P276
  • [10] IRI M, 1985, COMMON KNOWLEDGE NUM, pCH9
123