Magnification and scanning time dependence of secondary electron image contrast of ferroelectric domains in aged triglycine sulphate crystal

被引:2
作者
Aoyagi, S
Ozaki, T
机构
[1] Kansai Applicat Res Ctr, JEOL, Yodogawa Ku, Osaka 5320011, Japan
[2] Hiroshima Univ, Fac Sci, Dept Phys Sci, Higashihiroshima 7398526, Japan
来源
JOURNAL OF ELECTRON MICROSCOPY | 1999年 / 48卷 / 02期
关键词
scanning electron microscope; secondary electron image; incident electron dose; ferroelectric domain; TGS;
D O I
10.1093/oxfordjournals.jmicro.a023657
中图分类号
TH742 [显微镜];
学科分类号
摘要
The influence of the incident electron dose on the secondary electron image (SEI) contrast of ferroelectric 180 degrees domains was investigated on a b plate of triglycine sulphate (TGS) without metallization. The TGS b plate aged at 20 degrees C was observed at 15 degrees C under various magnifications and scanning times while keeping an acceleration voltage of 0.7 kV and a current of 3 pA. We found that the SEI contrast between adjacent ends of domains diminished when the incident electron dose was larger than 0.5 mu C/cm(2) which is five times as large as the difference between spontaneous polarizations at 15 degrees C and 20 degrees C.
引用
收藏
页码:115 / 120
页数:6
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