TEM/SEM investigation of microstructural changes within the white etching area under rolling contact fatigue and 3-D crack reconstruction by focused ion beam

被引：155

作者：

Grabulov, A.

Ziese, U.

Zandbergen, H. W.

机构：

[1] NIMR, NL-2600 GA Delft, Netherlands

[2] Delft Univ Technol, Kavli Inst Nanosci, Natl Ctr HREM, NL-2628 CJ Delft, Netherlands

来源：

SCRIPTA MATERIALIA | 2007年 / 57卷 / 07期

关键词：

rolling contact fatigue (RCF); transmission electron microscopy (TEM); Ion-beam processing; recrystallization;

D O I：

10.1016/j.scriptamat.2007.06.024

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The white etching area (WEA) surrounding the cracks formed under high-cycle rolling contact fatigue was investigated by transmission electron microscopy (TEM) and Dual Beam (scanning electron microscopy (SEM)/focused ion beam). SEM revealed the initiation of cracks formed around artificially introduced Al2O3 inclusions in the model steel (composition similar to SAE 52100). TEM investigations showed a microstructural difference between the WEA (formation of nanocrystalline ferrite) and the steel matrix (tempered martensitic structure). A three-dimensional image of the crack reconstructed from similar to 400 Dual Beam cross-section images is reported. (c) 2007 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

引用

页码：635 / 638

页数：4

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