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TEM/SEM investigation of microstructural changes within the white etching area under rolling contact fatigue and 3-D crack reconstruction by focused ion beam
被引：154
|作者：
Grabulov, A.
Ziese, U.
Zandbergen, H. W.
机构：
[1] NIMR, NL-2600 GA Delft, Netherlands
[2] Delft Univ Technol, Kavli Inst Nanosci, Natl Ctr HREM, NL-2628 CJ Delft, Netherlands
关键词：
rolling contact fatigue (RCF);
transmission electron microscopy (TEM);
Ion-beam processing;
recrystallization;
D O I：
10.1016/j.scriptamat.2007.06.024
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ;
080502 ;
摘要：
The white etching area (WEA) surrounding the cracks formed under high-cycle rolling contact fatigue was investigated by transmission electron microscopy (TEM) and Dual Beam (scanning electron microscopy (SEM)/focused ion beam). SEM revealed the initiation of cracks formed around artificially introduced Al2O3 inclusions in the model steel (composition similar to SAE 52100). TEM investigations showed a microstructural difference between the WEA (formation of nanocrystalline ferrite) and the steel matrix (tempered martensitic structure). A three-dimensional image of the crack reconstructed from similar to 400 Dual Beam cross-section images is reported. (c) 2007 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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页码：635 / 638
页数：4
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