A high-speed low-voltage built-in current sensor

被引：9

作者：

Huang, TC

Huang, ML

Lee, KJ

机构：

来源：

IEEE INTERNATIONAL WORKSHOP ON IDDQ TESTING, DIGEST OF PAPERS | 1997年

关键词：

D O I：

10.1109/IDDQ.1997.633020

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

This paper presents a high-speed low-voltage built-in current sensor. It mainly utilizes a bulk-driven current mirror as a current sensor to reduce the power supply voltage drop. Based on this technique, we develop an analytic and empirical model to design the built-in current sensor. Experimental results show that the bulk-driven built-in current sensor can have high speed and low area overhead under a foul pouter supply voltage.

引用

页码：90 / 94

页数：5