Using degradation data for product reliability analysis

被引：0
|
作者：
Meeker, WQ [1 ]
Daganaksoy, N
Hahn, GJ
机构：
[1] Iowa State Univ, Ames, IA 50011 USA
[2] GE Co, Res & Dev, Schenectady, NY USA
来源：
QUALITY PROGRESS | 2001年 / 34卷 / 06期
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：60 / 65
页数：6
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