Impact of directional walk on atom probe microanalysis

被引:129
作者
Gault, B. [1 ]
Danoix, F. [2 ,3 ]
Hoummada, K. [4 ]
Mangelinck, D. [4 ]
Leitner, H. [3 ]
机构
[1] Univ Sydney, Australian Ctr Microscopy & Microanal, Sydney, NSW 2006, Australia
[2] Univ Rouen, CNRS, Grp Phys Mat, Rouen, France
[3] Univ Leoben, Dept Phys Met & Mat Testing, Leoben, Austria
[4] Univ Paul Cezanne, CNRS, IM2NP, Marseille, France
关键词
Atom probe tomography; Surface migration; Artefact; FIELD-EVAPORATION; SURFACE-DIFFUSION; POST-IONIZATION; TOMOGRAPHY; DESORPTION; RESOLUTION; CARBON; RECONSTRUCTION; PRECIPITATION; REARRANGEMENT;
D O I
10.1016/j.ultramic.2011.06.005
中图分类号
TH742 [显微镜];
学科分类号
摘要
In the atom probe microanalysis of steels, inconsistencies in the measured compositions of solutes (C, N) have often been reported, as well as their appearance as molecular ions. Here we propose that these issues might arise from surface migration of solute atoms over the specimen surface. Surface migration of solutes is evidenced by field-ion microscopy observations, and its consequences on atom probe microanalysis are detailed for a wide range of solute (P, Si, Mn, B, C and N). It is proposed that directional walk driven by field gradients over the specimen surface and thermally activated is the prominent effect. (C) 2011 Elsevier B.V. All rights reserved.
引用
收藏
页码:182 / 191
页数:10
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