Impact of directional walk on atom probe microanalysis

被引：129

作者：

Gault, B. ^{[1
]}

Danoix, F. ^{[2
,3
]}

Hoummada, K. ^{[4
]}

Mangelinck, D. ^{[4
]}

Leitner, H. ^{[3
]}

机构：

[1] Univ Sydney, Australian Ctr Microscopy & Microanal, Sydney, NSW 2006, Australia

[2] Univ Rouen, CNRS, Grp Phys Mat, Rouen, France

[3] Univ Leoben, Dept Phys Met & Mat Testing, Leoben, Austria

[4] Univ Paul Cezanne, CNRS, IM2NP, Marseille, France

来源：

ULTRAMICROSCOPY | 2012年 / 113卷

关键词：

Atom probe tomography; Surface migration; Artefact; FIELD-EVAPORATION; SURFACE-DIFFUSION; POST-IONIZATION; TOMOGRAPHY; DESORPTION; RESOLUTION; CARBON; RECONSTRUCTION; PRECIPITATION; REARRANGEMENT;

D O I：

10.1016/j.ultramic.2011.06.005

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

In the atom probe microanalysis of steels, inconsistencies in the measured compositions of solutes (C, N) have often been reported, as well as their appearance as molecular ions. Here we propose that these issues might arise from surface migration of solute atoms over the specimen surface. Surface migration of solutes is evidenced by field-ion microscopy observations, and its consequences on atom probe microanalysis are detailed for a wide range of solute (P, Si, Mn, B, C and N). It is proposed that directional walk driven by field gradients over the specimen surface and thermally activated is the prominent effect. (C) 2011 Elsevier B.V. All rights reserved.

引用

页码：182 / 191

页数：10

共 71 条

[1] SURFACE-DIFFUSION OF SB ON SI(111) MEASURED BY 2ND-HARMONIC MICROSCOPY [J].

ALLEN, CE ;

SEEBAUER, EG .

LANGMUIR, 1995, 11 (01) :186-190

[2] Jump processes in surface diffusion [J].

Antczak, Grazyna ;

Ehrlich, Gert .

SURFACE SCIENCE REPORTS, 2007, 62 (02) :39-61

[3] EFFECT OF AN ELECTRIC FIELD ON SURFACE DIFFUSION OF RHENIUM ADSORBED ON TUNGSTEN [J].

BASSETT, DW ;

PARSLEY, MJ .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1969, 2 (01) :13-&

[4] THERMAL REARRANGEMENT OF A PERFECTLY ORDERED TUNGSTEN SURFACE [J].

BASSETT, DW .

NATURE, 1963, 198 (487) :468-&

[5] STABILITY OF W2 AND WRE ADATOM CLUSTERS ON (110) TUNGSTEN SURFACES [J].

BASSETT, DW ;

TICE, DR .

SURFACE SCIENCE, 1973, 40 (03) :499-511

[6] SURFACE ATOM DISPLACEMENT PROCESSES [J].

BASSETT, DW .

SURFACE SCIENCE, 1975, 53 (DEC) :74-86

[7] THERMAL STABILITY AND REARRANGEMENT OF FIELD-EVAPORATED TUNGSTEN SURFACES [J].

BASSETT, DW .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1965, 286 (1405) :191-&

[8] AN ATOM-PROBE FOR 3-DIMENSIONAL TOMOGRAPHY [J].

BLAVETTE, D ;

BOSTEL, A ;

SARRAU, JM ;

DECONIHOUT, B ;

MENAND, A .

NATURE, 1993, 363 (6428) :432-435

[9] Advances in pulsed-laser atom probe: Instrument and specimen design for optimum performance [J].

Bunton, Joseph H. ;

Olson, Jesse D. ;

Lenz, Daniel R. ;

Kelly, Thomas F. .

MICROSCOPY AND MICROANALYSIS, 2007, 13 (06) :418-427

[10] ATOMIC RESOLUTION OF A FIELD ION MICROSCOPE [J].

CHEN, YC ;

SEIDMAN, DN .

SURFACE SCIENCE, 1971, 26 (01) :61-&

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