Total sulfur concentration in geological reference materials by elemental infrared analyser

被引:46
作者
Bedard, L. Paul [1 ]
Savard, Dany [1 ]
Barnes, Sarah-Jane [1 ]
机构
[1] Univ Quebec, SCITER, Chicoutimi, PQ G7H 5Z1, Canada
关键词
sulfur; infrared analyser; reference materials; CCRMP SY-2;
D O I
10.1111/j.1751-908X.2008.00881.x
中图分类号
P3 [地球物理学]; P59 [地球化学];
学科分类号
0708 ; 070902 ;
摘要
Total sulfur is an analyte for which there are few determinations published, despite the fact that it is a very important element (e.g., a major element in most ores, an important gas constituent in global warming, an active participant in acid drainage). Most geological reference materials have very poor quality sulfur results, that is with relative standard deviations (RSD) in the range of 30-50%, even for concentrations over 100 mu g g(-1) S, which compromises their use as calibrators. In order to provide modern results with low RSD, sulfur was determined in twenty-nine geological reference materials with a state-of-the-art elemental S/C analyser using metal chips (certified reference materials with a traceability link) and analytical grade sulfur for high concentration samples. Analytical parameters (sample mass, crucible degassing, calibration strategy, etc.) were optimised by testing. Our results agreed with reference material values provided by issuing bodies. Results for CCRMP SY-2 (129 +/- 13 mu g g(-1) S), which has been proposed as a sulfur reference material, were in agreement with the proposed modern value of 122 +/- 3.7 mu g g(-1) S.
引用
收藏
页码:203 / 208
页数:6
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