Angle-resolved spectral Fabry-Perot interferometer for single-shot measurement of refractive index dispersion over a broadband spectrum

被引:1
|
作者
Dong, J. T. [1 ]
Ji, F. [1 ]
Xia, H. J. [1 ]
Liu, Z. J. [1 ]
Zhang, T. D. [1 ]
Yang, L. [1 ]
机构
[1] Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Hefei 230009, Anhui, Peoples R China
基金
中国国家自然科学基金;
关键词
Fabry-Perot interferometer; refractive index dispersion; thickness; THICKNESS; PLATE;
D O I
10.1088/1361-6501/aa96e4
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
An angle-resolved spectral Fabry-Perot interferometer is reported for fast and accurate measurement of the refractive index dispersion of optical materials with parallel plate shape. The light sheet from the wavelength tunable laser is incident on the parallel plate with converging angles. The transmitted interference light for each angle is dispersed and captured by a 2D sensor, in which the rows and the columns are used to simultaneously record the intensities as a function of wavelength and incident angle, respectively. The interferogram, named angle-resolved spectral intensity distribution, is analyzed by fitting the phase information instead of finding the fringe peak locations that present periodic ambiguity. The refractive index dispersion and the physical thickness can be then retrieved from a singleshot interferogram within 18 s. Experimental results of an optical substrate standard indicate that the accuracy of the refractive index dispersion is less than 2.5 x 10(-5) and the relative uncertainty of the thickness is 6 x 10(-5) mm (3 sigma) due to the high stability and the single-shot measurement of the proposed system.
引用
收藏
页数:8
相关论文
共 33 条
  • [1] Instantaneous thickness measurement of multilayer films by single-shot angle-resolved spectral reflectometry
    Ghim, Young-Sik
    Rhee, Hyug-Gyo
    OPTICS LETTERS, 2019, 44 (22) : 5418 - 5421
  • [2] Simultaneous measurement of refractive index and temperature based on asymmetrical Fabry-Perot interferometer
    Wu, Yue
    Li, Hong
    Yan, Guang
    Meng, Fanyong
    Zhu, Lianqing
    MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, 2019, 61 (09) : 2190 - 2195
  • [3] Hybrid Fabry-Perot interferometer for simultaneous liquid refractive index and temperature measurement
    Xu, Ben
    Yang, Yi
    Jia, Zhenbao
    Wang, D. N.
    OPTICS EXPRESS, 2017, 25 (13): : 14483 - 14493
  • [4] All-Fiber Fabry-Perot Interferometer for Liquid Refractive Index Measurement
    Jiang, Jiuxing
    Zhao, Yuxin
    Yang, Yugiang
    Wang, Yongguang
    He, Xunjun
    Yang, Wenlong
    Li, Linjun
    JOURNAL OF RUSSIAN LASER RESEARCH, 2019, 40 (04) : 370 - 374
  • [5] A Microcavity Fiber Fabry-Perot Interferometer for Measuring Refractive Index and Material Dispersion of Liquids
    Gu, Jheng-Hong
    Ho, Hsuan-Yu
    Lee, Cheng-Ling
    Lin, Yuan-Yao
    2015 OPTO-ELECTRONICS AND COMMUNICATIONS CONFERENCE (OECC), 2015,
  • [6] The spectrum of a bent fiber Fabry-Perot interferometer under small variations of the refractive index of the environment
    Gurbatov, Stanislav O.
    Kulchin, Yury N.
    Vitrik, Oleg B.
    INTERFEROMETRY XVI: APPLICATIONS, 2012, 8494
  • [7] Measurement of refractive index dispersion of a fused silica plate using Fabry-Perot interference
    Lee, Choonghwan
    Choi, Heejoo
    Jin, Jonghan
    Cha, Myoungsik
    APPLIED OPTICS, 2016, 55 (23) : 6285 - 6291
  • [8] Large-range refractive index measurement method for open cavity Fabry-Perot interferometer
    Zhang, Cheng
    Yang, Dan
    Miao, Changyun
    Zhao, Junfa
    Li, Hongqiang
    Bai, Hua
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2019, 30 (03)
  • [9] Miniaturized Fiber-Optic Fabry-Perot Interferometer for Highly Sensitive Refractive Index Measurement
    Deng, Ming
    Zhu, Tao
    Rao, Yun-Jiang
    Li, Hong
    APOS: 2008 1ST ASIA-PACIFIC OPTICAL FIBER SENSORS CONFERENCE, 2008, : 19 - 22
  • [10] Miniaturized Fiber-Optic Fabry-Perot Interferometer for Highly Sensitive Refractive Index Measurement
    M. Deng and H. Li are with the Key Laboratory of Optoelectronic Technology and Systems
    Journal of Electronic Science and Technology, 2008, 6 (04) : 365 - 368