Principal angles and principal azimuths of a high-index transparent thin film on a low-index transparent substrate: Si on glass in the near infrared

被引:0
作者
Azzam, R. M. A. [1 ]
机构
[1] Univ New Orleans, Dept Elect Engn, New Orleans, LA 70148 USA
来源
OPTIK | 2020年 / 207卷
关键词
Thin films; Polarization; Reflection; Ellipsometry; Physical optics; TOTAL INTERNAL-REFLECTION;
D O I
10.1016/j.ijleo.2019.163780
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Principal angles of incidence and associated principal azimuths, at which incident linearly polarized light becomes circularly polarized upon reflection, are determined for an IR-transparent high-index Si film (of the proper thickness) which is deposited on a low-index SiO2 (glass) substrate at the near-IR wavelength lambda = 1.55 The results are substantially different from those reported by the author [Appl. Opt 57, 9529-9532 (2018)] for the SiO2-Si (film-substrate) system at the same wavelength. The intensity reflectances for incident p- and s-polarized light, and the linear-to-circular polarization conversion efficiency are also calculated as functions of the principal angle.
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页数:6
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