Principal angles and principal azimuths of a high-index transparent thin film on a low-index transparent substrate: Si on glass in the near infrared
被引:0
作者:
Azzam, R. M. A.
论文数: 0引用数: 0
h-index: 0
机构:
Univ New Orleans, Dept Elect Engn, New Orleans, LA 70148 USAUniv New Orleans, Dept Elect Engn, New Orleans, LA 70148 USA
Azzam, R. M. A.
[1
]
机构:
[1] Univ New Orleans, Dept Elect Engn, New Orleans, LA 70148 USA
来源:
OPTIK
|
2020年
/
207卷
关键词:
Thin films;
Polarization;
Reflection;
Ellipsometry;
Physical optics;
TOTAL INTERNAL-REFLECTION;
D O I:
10.1016/j.ijleo.2019.163780
中图分类号:
O43 [光学];
学科分类号:
070207 ;
0803 ;
摘要:
Principal angles of incidence and associated principal azimuths, at which incident linearly polarized light becomes circularly polarized upon reflection, are determined for an IR-transparent high-index Si film (of the proper thickness) which is deposited on a low-index SiO2 (glass) substrate at the near-IR wavelength lambda = 1.55 The results are substantially different from those reported by the author [Appl. Opt 57, 9529-9532 (2018)] for the SiO2-Si (film-substrate) system at the same wavelength. The intensity reflectances for incident p- and s-polarized light, and the linear-to-circular polarization conversion efficiency are also calculated as functions of the principal angle.