Effect of metallization on the lifetime prediction of mechanically stressed low-temperature co-fired ceramics multilayers

Multilayer ceramics based on Low-Temperature Co-fired Ceramics (LTCC) are gaining increasing interest in the manufacturing of high-integrated devices for microelectronic and sensor applications. In many applications the parts are exposed to mechanical stresses, which is an important issue regarding the reliability of the device. To predict the lifetime of LTCC multilayer devices, and to extend their application range, basic mechanical data of this material are needed. In this paper metallized LTCC multilayers are investigated concerning their flexural strength, crack growth rate, and lifetime prediction. The results show that the electronic layout concerning the location of vias and metallization has a strong influence on the reliability and lifetime prediction of such co-fired LTCC devices. Mass How sensors for the measurement of injected fuel quantities, which were fabricated on the basis of LTCC and which are exposed to a stress level of 100 MPa, achieve sufficient lifetimes. Therefore, LTCC is an interesting material to fabricate devices, in which LTCC fulfils the requirements of a functional and structural material.