Crystal orientation effect on spin injection/detection efficiency in Si lateral spin-valve devices

被引:2
作者
Ishikawa, Mizue [1 ]
Tsukahara, Makoto [1 ]
Honda, Syuta [2 ,3 ]
Fujita, Yuichi [1 ]
Yamada, Michihiro [1 ]
Saito, Yoshiaki [4 ]
Kimura, Takashi [3 ,5 ]
Itoh, Hiroyoshi [2 ,3 ]
Hamaya, Kohei [1 ,3 ]
机构
[1] Osaka Univ, Grad Sch Engn Sci, Dept Syst Innovat, 1-3 Machikaneyama, Toyonaka, Osaka 5608531, Japan
[2] Kansai Univ, Fac Engn Sci, Dept Pure & Appl Phys, 3-3-35 Yamate, Suita, Osaka 5648680, Japan
[3] Osaka Univ, Grad Sch Engn Sci, Ctr Spintron Res Network, 1-3 Machikaneyama, Toyonaka, Osaka 5608531, Japan
[4] Tohoku Univ, Ctr Innovat Integrated Elect Syst, 468-1 Aramaki Aza Aoba, Sendai, Miyagi 9800845, Japan
[5] Kyushu Univ, Dept Phys, 744 Motooka, Fukuoka, Fukuoka 8190395, Japan
基金
日本学术振兴会;
关键词
spin injection; spin transport; semiconductor spintronics; ELECTRICAL DETECTION; LOGIC;
D O I
10.1088/1361-6463/aaf37c
中图分类号
O59 [应用物理学];
学科分类号
摘要
We show evident crystal orientation effect on pure spin current transport in Si-based lateral spin-valve (LSV) devices with epitaxially grown CoFe/MgO tunnel contacts. When we compare nonlocal spin signals between LSV devices along < 1 0 0 > (Si < 1 0 0 >) and < 1 1 0 > (Si < 1 1 0 >), we find that the magnitude of the spin signals for Si < 100 > LSV devices is always larger than that for Si < 1 1 0 > LSV devices. The analyses based on the one-dimensional spin diffusion model reveal that the spin diffusion length and spin lifetime between Si < 1 0 0 > and Si < 1 1 0 > LSV devices are comparable, while the spin injection/detection efficiency in Si < 1 0 0 > LSV devices is evidently larger than that in Si < 1 1 0 > ones. Possible origins of the difference in the spin injection/detection efficiency between Si < 1 0 0 > and Si < 1 1 0 > LSV devices are discussed.
引用
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页数:8
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[1]   Large pure spin current generation in metallic nanostructures [J].
Bakaul, Saidur R. ;
Hu, Shaojie ;
Kimura, Takashi .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2013, 111 (02) :355-360
[2]   Valence band effective-mass expressions in the sp3d5s* empirical tight-binding model applied to a Si and Ge parametrization -: art. no. 115201 [J].
Boykin, TB ;
Klimeck, G ;
Oyafuso, F .
PHYSICAL REVIEW B, 2004, 69 (11)
[3]   Probing the electronic band structure of ferromagnets with spin injection and extraction [J].
Bruski, Pawel ;
Erwin, Steven C. ;
Herfort, Jens ;
Tahraoui, Abbes ;
Ramsteiner, Manfred .
PHYSICAL REVIEW B, 2014, 90 (24)
[4]  
Choi WY, 2015, NAT NANOTECHNOL, V10, P666, DOI [10.1038/NNANO.2015.107, 10.1038/nnano.2015.107]
[5]   Electrical spin injection and detection in lateral all-semiconductor devices [J].
Ciorga, M. ;
Einwanger, A. ;
Wurstbauer, U. ;
Schuh, D. ;
Wegscheider, W. ;
Weiss, D. .
PHYSICAL REVIEW B, 2009, 79 (16)
[6]   Spin-based logic in semiconductors for reconfigurable large-scale circuits [J].
Dery, H. ;
Dalal, P. ;
Cywinski, L. ;
Sham, L. J. .
NATURE, 2007, 447 (7144) :573-576
[7]   Tunneling anisotropic spin polarization in lateral (Ga,Mn)As/GaAs spin Esaki diode devices [J].
Einwanger, A. ;
Ciorga, M. ;
Wurstbauer, U. ;
Schuh, D. ;
Wegscheider, W. ;
Weiss, D. .
APPLIED PHYSICS LETTERS, 2009, 95 (15)
[8]   Conditions for efficient spin injection from a ferromagnetic metal into a semiconductor -: art. no. 184420 [J].
Fert, A ;
Jaffrès, H .
PHYSICAL REVIEW B, 2001, 64 (18)
[9]   Spin diffusion in semiconductors [J].
Flatté, ME ;
Byers, JM .
PHYSICAL REVIEW LETTERS, 2000, 84 (18) :4220-4223
[10]   Spin Transport and Relaxation up to 250 K in Heavily Doped n-Type Ge Detected Using Co2FeAl0.5Si0.5 Electrodes [J].
Fujita, Y. ;
Yamada, M. ;
Tsukahara, M. ;
Oka, T. ;
Yamada, S. ;
Kanashima, T. ;
Sawano, K. ;
Hamaya, K. .
PHYSICAL REVIEW APPLIED, 2017, 8 (01)