Contact resistance of multiwall carbon nanotubes

被引:45
|
作者
Wakaya, F
Katayama, K
Gamo, K
机构
[1] Osaka Univ, Grad Sch Engn Sci, Dept Phys Sci, Toyonaka, Osaka 5608531, Japan
[2] Osaka Univ, Res Ctr Mat Sci Extreme Condit, Toyonaka, Osaka 5608531, Japan
关键词
carbon nanotube; contact resistance;
D O I
10.1016/S0167-9317(03)00147-3
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Multiwall carbon nanotubes (CNTs) with Au/Ti electrodes were fabricated. The zero-bias resistances were measured at room temperature. The resistance was dominated by the contact resistance and was not significantly affected by the intrinsic resistance of the CNTs which should be determined by diameter, chirality, defect and bend of the CNTs. It is shown that the contact resistance can be controlled by the length of part of the CNT which is covered by the electrode. At low temperature, the multiwall CNT behaved as a single Coulomb island without dividing into several islands. In this case, the contact resistance between the CNT and the metal formed the tunnel resistance in Coulomb blockade unlike the case of single-wall CNT. (C) 2003 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:853 / 857
页数:5
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