A new linear transfer theory and characterization method for image detectors. Part II: Experiment

被引:20
作者
Lubk, Axel [1 ,2 ,6 ]
Roeder, Falk [1 ]
Niermann, Tore [3 ]
Gatel, Christophe [2 ,6 ]
Joulie, Sebastien [2 ,6 ]
Houdellier, Florent [2 ,6 ]
Magen, Cesar [4 ,5 ,6 ]
Hytch, Martin J. [2 ,6 ]
机构
[1] Tech Univ Dresden, Inst Struct Phys, Triebenberg Lab, D-01062 Dresden, Germany
[2] CEMES CNRS, F-31055 Toulouse, France
[3] Tech Univ Berlin, Inst Opt & Atomare Phys, D-10623 Berlin, Germany
[4] Univ Zaragoza, Inst Nanociencia Aragon INA ARAID, LMA, Zaragoza 50018, Spain
[5] Univ Zaragoza, Dept Fis Mat Condensada, Zaragoza 50018, Spain
[6] Univ Zaragoza, CNRS, CEMES INA, Transpyrenean Associated Lab Electron Microscopy, Zaragoza 50018, Spain
关键词
Detection quantum efficiency; Point spread function; Modulation transfer function; Image detector; ELECTRON DETECTION; CCD CAMERAS; NOISE TRANSFER; SIGNAL; PERFORMANCE; MICROSCOPY; SCATTERING;
D O I
10.1016/j.ultramic.2012.01.011
中图分类号
TH742 [显微镜];
学科分类号
摘要
A novel generalized linear transfer theory describing the signal and noise transfer in image detectors has been developed in Part I (Niermann, this issue, [1]) of this paper. Similar to the existing notion of a point spread function (PSF) describing the transfer of the first statistical moment (the average), a noise spread function (NSF) was introduced to characterize the spatially resolved transfer of noise (central second moment, covariance). Following the theoretic results developed in Part I (Niermann, this issue, [1]), a new experimental method based on single spot illumination has been developed and applied to measure 2D point and 4D noise spread functions of CCD cameras used in TEM. A dedicated oversampling method has been used to suppress aliasing in the measured quantities. We analyze the 4D noise spread with respect to electronic and photonic noise contributions. (C) 2012 Elsevier B.V. All rights reserved.
引用
收藏
页码:78 / 87
页数:10
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